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Chao; Chuan-Jane Patent Filings

Chao; Chuan-Jane

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chao; Chuan-Jane.The latest application filed is for "fixed voltage generating circuit".

Company Profile
0.13.11
  • Chao; Chuan-Jane - Taipei TW
  • Chao; Chuan-Jane - Hsinchu N/A TW
  • Chao; Chuan-Jane - Taipei City TW
  • Chao, Chuan-Jane - Hsinchu City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Fixed voltage generating circuit
Grant 9,088,252 - Chen , et al. July 21, 2
2015-07-21
Piezoresistive type Z-axis accelerometer
Grant 9,052,332 - Huang , et al. June 9, 2
2015-06-09
Sensing apparatus
Grant 8,904,868 - Huang , et al. December 9, 2
2014-12-09
Fixed Voltage Generating Circuit
App 20140253088 - Chen; Chih-Sheng ;   et al.
2014-09-11
Compound semiconductor device and method for fabricating the same
Grant 8,580,627 - Peng , et al. November 12, 2
2013-11-12
Piezoresistive Type Z-axis Accelerometer
App 20130091949 - HUANG; Chih-Wei ;   et al.
2013-04-18
Sensing Apparatus
App 20120285245 - HUANG; Chih-Wei ;   et al.
2012-11-15
Compound Semiconductor Device and Method for Fabricating the Same
App 20110291226 - Peng; Kuo-Jui ;   et al.
2011-12-01
Adaptive bias circuit and system thereof
Grant 8,026,767 - Chen , et al. September 27, 2
2011-09-27
Adaptive Bias Circuit And System Thereof
App 20110043287 - Chen; Chih-Wei ;   et al.
2011-02-24
High-efficiency single to differential amplifier
Grant 7,692,493 - Chen , et al. April 6, 2
2010-04-06
LC resonant circuit
Grant 7,671,704 - Hsu , et al. March 2, 2
2010-03-02
LC resonant circuit
App 20080169883 - Hsu; Chia-Jen ;   et al.
2008-07-17
Method and test structures for measuring interconnect coupling capacitance in an IC chip
Grant 6,870,387 - Huang , et al. March 22, 2
2005-03-22
ESD protection devices and methods to reduce trigger voltage
Grant 6,858,900 - Chen , et al. February 22, 2
2005-02-22
Method and test structures for measuring interconnect coupling capacitance in an IC chip
App 20050024077 - Huang, Kai-Ye ;   et al.
2005-02-03
ESD protection devices and methods to reduce trigger voltage
App 20030067040 - Chen, Wei-Fan ;   et al.
2003-04-10
Method for fabricating a capacitor device with BiCMOS process and the capacitor device formed thereby
App 20020123191 - Huang, Chih-Mu ;   et al.
2002-09-05
Testing method for buried strap and deep trench leakage current
App 20020118035 - Yang, Shih-Hsien ;   et al.
2002-08-29
Testing method for buried strap and deep trench leakage current
Grant 6,377,067 - Yang , et al. April 23, 2
2002-04-23

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