Changchien; Wei-Pin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Changchien; Wei-Pin.The latest application filed is for "machine-learning design enablement platform".

Company Profile

6.24.20

Changchien; Wei-Pin - Taichung TW
CHANGCHIEN; Wei-Pin - Taichung City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Machine-learning design enablement platform Grant 11,017,149 - Chuang , et al. May 25, 2	2021-05-25
System and method to diagnose integrated circuit Grant 10,866,281 - Changchien , et al. December 15, 2	2020-12-15
Machine-Learning Design Enablement Platform App 20200272777 - CHUANG; Yi-Lin ; et al.	2020-08-27
Machine-learning design enablement platform Grant 10,678,973 - Chuang , et al.	2020-06-09
System And Method To Diagnose Integrated Circuit App 20190242943 - CHANGCHIEN; WEI-PIN ; et al.	2019-08-08
System and method to diagnose integrated circuit Grant 10,267,853 - Changchien , et al.	2019-04-23
Machine-learning Design Enablement Platform App 20180268096 - CHUANG; Yi-Lin ; et al.	2018-09-20
Monolithic stacked integrated circuits with a redundant layer for repairing defects Grant 9,847,318 - Lin , et al. December 19, 2	2017-12-19
System And Method To Diagnose Integrated Circuit App 20170176525 - CHANGCHIEN; WEI-PIN ; et al.	2017-06-22
Oxide definition (OD) gradient reduced semiconductor device Grant 9,601,478 - Chuang , et al. March 21, 2	2017-03-21
Integrated circuit comprising buffer chain Grant 9,478,469 - Chuang , et al. October 25, 2	2016-10-25
Oxide Definition (od) Gradient Reduced Semiconductor Device App 20160163687 - CHUANG; Yi-Lin ; et al.	2016-06-09
Repairing Monolithic Stacked Integrated Circuits with a Redundant Layer and Lithography Process App 20160163680 - Lin; Kuan-Yu ; et al.	2016-06-09
Diagnosis framework to shorten yield learning cycles of advanced processes Grant 9,310,431 - Liu , et al. April 12, 2	2016-04-12
Scan Flip-flop App 20160091563 - Lu; Chuang-Hao ; et al.	2016-03-31
Oxide definition (OD) gradient reduced semiconductor device and method of making Grant 9,286,431 - Chuang , et al. March 15, 2	2016-03-15
Repairing monolithic stacked integrated circuits with a redundant layer and lithography process Grant 9,269,640 - Lin , et al. February 23, 2	2016-02-23
Method and apparatus for diagnosing an integrated circuit Grant 9,097,762 - Tong , et al. August 4, 2	2015-08-04
Integrated Circuit Comprising Buffer Chain App 20150187666 - Chuang; Yi-Lin ; et al.	2015-07-02
Method and Apparatus for Repairing Monolithic Stacked Integrated Circuits App 20150115329 - Lin; Kuan-Yu ; et al.	2015-04-30
Oxide Definition (od) Gradient Reduced Semiconductor Device And Method Of Making App 20150115395 - CHUANG; Yi-Lin ; et al.	2015-04-30
Integrated circuit comprising buffer chain Grant 8,981,842 - Chuang , et al. March 17, 2	2015-03-17
Voltage-controlled oscillator Grant 8,937,512 - Huang , et al. January 20, 2	2015-01-20
Group bounding box region-constrained placement for integrated circuit design Grant 8,701,070 - Chuang , et al. April 15, 2	2014-04-15
Group Bounding Box Region-constrained Placement For Integrated Circuit Design App 20140075404 - Chuang; Yi-Lin ; et al.	2014-03-13
Diagnosis Framework to Shorten Yield Learning Cycles of Advanced Processes App 20140049281 - Liu; Yen-Ling ; et al.	2014-02-20
Method and Apparatus for Diagnosing an Integrated Circuit App 20130305112 - Tong; Kin Lam ; et al.	2013-11-14
Method for detecting small delay defects Grant 8,566,766 - Goel , et al. October 22, 2	2013-10-22
RC delay detectors with high sensitivity for through substrate vias Grant 8,384,430 - Tseng , et al. February 26, 2	2013-02-26
System and method for reducing processor power consumption Grant 8,347,132 - Lu , et al. January 1, 2	2013-01-01
System and method for detecting soft-fails Grant 8,339,155 - Tseng , et al. December 25, 2	2012-12-25
System and method for characterizing process variations Grant 8,258,883 - Chen , et al. September 4, 2	2012-09-04
Method for Detecting Small Delay Defects App 20120112763 - Goel; Sandeep Kumar ; et al.	2012-05-10
RC Delay Detectors with High Sensitivity for Through Substrate Vias App 20120038388 - Tseng; Nan-Hsin ; et al.	2012-02-16
Methods for detecting defect connections between metal bumps Grant 8,113,412 - Tseng , et al. February 14, 2	2012-02-14
System and Method for Detecting Soft-Fails App 20110121856 - Tseng; Nan-Hsin ; et al.	2011-05-26
System and Method for Characterizing Process Variations App 20100176890 - Chen; Yi-Wei ; et al.	2010-07-15
System and Method for Reducing Processor Power Consumption App 20100174933 - Lu; Lee-Chung ; et al.	2010-07-08

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