Patent | Date |
---|
Methodology for implementing enhanced optical lithography for hole patterning in semiconductor fabrication Grant 9,366,969 - Liu , et al. June 14, 2 | 2016-06-14 |
Contrast enhancing exposure system and method for use in semiconductor fabrication Grant 9,091,923 - Liu , et al. July 28, 2 | 2015-07-28 |
Method for patterning a photosensitive layer Grant 8,815,496 - Lu , et al. August 26, 2 | 2014-08-26 |
Method for etching an ultra thin film Grant 8,623,231 - Liu , et al. January 7, 2 | 2014-01-07 |
Methodology For Implementing Enhanced Optical Lithography For Hole Patterning In Semiconductor Fabrication App 20130286371 - Liu; George ;   et al. | 2013-10-31 |
Method for Patterning a Photosensitive Layer App 20130164686 - Lu; Hsiao-Tzu ;   et al. | 2013-06-27 |
Methodology for implementing enhanced optical lithography for hole patterning in semiconductor fabrication Grant 8,472,005 - Liu , et al. June 25, 2 | 2013-06-25 |
Method for patterning a photosensitive layer Grant 8,394,576 - Lu , et al. March 12, 2 | 2013-03-12 |
Method For Patterning A Photosensitive Layer App 20120114872 - Lu; Hsiao-Tzu ;   et al. | 2012-05-10 |
Method for patterning a photosensitive layer Grant 8,124,323 - Lu , et al. February 28, 2 | 2012-02-28 |
Pattern formation in semiconductor fabrication Grant 8,119,533 - Liu , et al. February 21, 2 | 2012-02-21 |
Dummy vias for damascene process Grant 7,960,821 - Chen , et al. June 14, 2 | 2011-06-14 |
Dummy vias for damascene process Grant 7,767,570 - Chen , et al. August 3, 2 | 2010-08-03 |
Dummy Vias For Damascene Process App 20100155963 - Chen; Kuei Shun ;   et al. | 2010-06-24 |
Pattern Formation In Semiconductor Fabrication App 20100109054 - Liu; George ;   et al. | 2010-05-06 |
Method of pattern formation in semiconductor fabrication Grant 7,648,918 - Liu , et al. January 19, 2 | 2010-01-19 |
Semiconductor device having in-chip critical dimension and focus patterns Grant 7,642,101 - Liu , et al. January 5, 2 | 2010-01-05 |
Method For Etching An Ultra Thin Film App 20090311628 - Liu; George ;   et al. | 2009-12-17 |
Method For Patterning A Photosensitive Layer App 20090081591 - Lu; Hsiao-Tzu ;   et al. | 2009-03-26 |
Method Of Pattern Formation In Semiconductor Fabrication App 20090053899 - Liu; George ;   et al. | 2009-02-26 |
Immersion lithography process and mask layer structure applied in the same Grant 7,432,042 - Chang , et al. October 7, 2 | 2008-10-07 |
Methodology For Implementing Enhanced Optical Lithography For Hole Patterning In Semiconductor Fabrication App 20080204688 - Liu; George ;   et al. | 2008-08-28 |
Contrast Enhancing Exposure System and Method For Use In Semiconductor Fabrication App 20080206679 - Liu; George ;   et al. | 2008-08-28 |
Method of measuring the overlay accuracy of a multi-exposure process App 20080153012 - Liu; George ;   et al. | 2008-06-26 |
Top patterned hardmask and method for patterning Grant 7,387,969 - Liu , et al. June 17, 2 | 2008-06-17 |
Semiconductor Device Having In-Chip Critical Dimension and Focus Patterns App 20080128924 - Liu; George ;   et al. | 2008-06-05 |
Method and System For Making Photo-Resist Patterns App 20080102648 - Lin; Chin-Hsiang ;   et al. | 2008-05-01 |
Dummy Vias For Damascene Process App 20070224795 - CHEN; Kuei Shun ;   et al. | 2007-09-27 |
Top patterned hardmask and method for patterning App 20060211254 - Liu; George ;   et al. | 2006-09-21 |
Method of measuring the overlay accuracy of a multi-exposure process App 20050244729 - Liu, George ;   et al. | 2005-11-03 |
Immersion lithography process and mask layer structure applied in the same App 20050123863 - Chang, Vencent ;   et al. | 2005-06-09 |
Sandwich photoresist structure in photolithographic process Grant 6,844,143 - Lin , et al. January 18, 2 | 2005-01-18 |
Method for shrinking pattern photoresist App 20040166447 - Chang, Vencent ;   et al. | 2004-08-26 |
Method for shrinking the image of photoresist App 20040166448 - Chang, Vencent ;   et al. | 2004-08-26 |
Method for planarizing barc layer in dual damascene process Grant 6,680,252 - Chen , et al. January 20, 2 | 2004-01-20 |
Sandwich photoresist structure in phtotlithographic process App 20040009434 - Lin, Benjamin Szu-Min ;   et al. | 2004-01-15 |
Method for planarizing barc layer in dual damascene process App 20020173152 - Chen, Anseime ;   et al. | 2002-11-21 |