Chang; Shunhua

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chang; Shunhua.The latest application filed is for "integrated circuit protection during high-current esd testing".

Company Profile

1.10.7

Chang; Shunhua - South Burlington VT
Chang; Shunhua - Essex Junction VT US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated circuit protection during high-current ESD testing Grant 10,359,461 - Chang , et al.	2019-07-23
Integrated Circuit Protection During High-current Esd Testing App 20180100883 - CHANG; SHUNHUA ; et al.	2018-04-12
Integrated Circuit Protection During High-current Esd Testing App 20180100884 - CHANG; SHUNHUA ; et al.	2018-04-12
Integrated circuit protection during high-current ESD testing Grant 9,869,708 - Chang , et al. January 16, 2	2018-01-16
Integrated circuit protection during high-current ESD testing Grant 9,435,841 - Chang , et al. September 6, 2	2016-09-06
Integrated Circuit Protection During High-current Esd Testing App 20160033564 - CHANG; SHUNHUA ; et al.	2016-02-04
Electrostatic discharge (ESD) device and method of fabricating Grant 8,803,276 - Chang , et al. August 12, 2	2014-08-12
Electrostatic Discharge (esd) Device And Method Of Fabricating App 20140061803 - CHANG; Shunhua ; et al.	2014-03-06
Electrostatic discharge (ESD) device and method of fabricating Grant 8,597,993 - Chang , et al. December 3, 2	2013-12-03
Integrated Circuit Protection During High-current Esd Testing App 20130271883 - Chang; Shunhua ; et al.	2013-10-17
SCR/MOS clamp for ESD protection of integrated circuits Grant 8,354,722 - Campi, Jr. , et al. January 15, 2	2013-01-15
Vertical NPNP structure in a triple well CMOS process Grant 8,299,533 - Campi, Jr. , et al. October 30, 2	2012-10-30
Eletrostatic Discharge (esd) Device And Method Of Fabricating App 20090231766 - Chang; Shunhua ; et al.	2009-09-17

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