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name:-0.0060880184173584
name:-0.011190176010132
name:-0.0013940334320068
Chang; Chao-Hsin Patent Filings

Chang; Chao-Hsin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chang; Chao-Hsin.The latest application filed is for "protection device and method for electronic device".

Company Profile
0.9.5
  • Chang; Chao-Hsin - New Taipei TW
  • Chang; Chao-Hsin - New Taipei City TW
  • Chang; Chao Hsin - Coral Gables FL
  • Chang; Chao-Hsin - Hsin-Chu City TW
  • Chang; Chao-Hsin - Hsinchu TW
  • Chang; Chao-Hsin - Hsin-Chu TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Protection device and method for electronic device
Grant 9,825,454 - Chang , et al. November 21, 2
2017-11-21
Protection Device and Method for Electronic Device
App 20160072274 - Chang; Chao-Hsin ;   et al.
2016-03-10
Sole ventilation system
Grant 7,818,896 - Hsieh , et al. October 26, 2
2010-10-26
Sole
App 20090083995 - Hsieh; Kan-zen ;   et al.
2009-04-02
System and methods for packing in turnkey services
App 20070042532 - Tsai; Jung-Yi ;   et al.
2007-02-22
System and method of reserving capacity for a pre-process order
Grant 7,003,365 - Yen , et al. February 21, 2
2006-02-21
Microelectronic fabrication production control method and system providing enhanced microelectronic fabrication facility utilization flexibility
Grant 6,728,586 - Chang , et al. April 27, 2
2004-04-27
Microelectronic fabrication production control method and system providing enhanced microelectronic fabrication facility utilization flexibility
App 20030135297 - Chang, Chao-Hsin ;   et al.
2003-07-17
Capacity auction method and system providing enhanced fabrication facility utilization
App 20020095366 - Chang, Chao-Hsin
2002-07-18
Method and system for yield loss analysis by yield management system
Grant 6,389,323 - Yang , et al. May 14, 2
2002-05-14
Test pattern for monitoring metal corrosion on integrated circuit wafers
Grant 6,261,843 - Chang , et al. July 17, 2
2001-07-17
Method and system for yield loss analysis by yield management system
Grant 6,017,771 - Yang , et al. January 25, 2
2000-01-25
Method for reducing precipitate defects using a plasma treatment post BPSG etchback
Grant 5,783,493 - Yeh , et al. July 21, 1
1998-07-21
Process to avoid dielectric damage at the flat edge of the water
Grant 5,783,097 - Lo , et al. July 21, 1
1998-07-21

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