Patent | Date |
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Probe Device For Scanning Probe Microscopes And Method Of Manufacture Thereof App 20170184631 - Chand; Ami ;   et al. | 2017-06-29 |
Vertical embedded sensor and process of manufacturing thereof Grant 9,389,244 - Goeckeritz , et al. July 12, 2 | 2016-07-12 |
Vertical Embedded Sensor and Process of Manufacturing Thereof App 20140338075 - Goeckeritz; Jeremy J. ;   et al. | 2014-11-13 |
Probe for a scanning probe microscope and method of manufacture Grant 8,857,247 - Kjoller , et al. October 14, 2 | 2014-10-14 |
Scanning probe having integrated silicon tip with cantilever Grant 8,828,243 - Poddar , et al. September 9, 2 | 2014-09-09 |
Scanning probe devices Grant 8,397,555 - Chand March 19, 2 | 2013-03-19 |
Scanning probe having integrated silicon tip with cantilever App 20120060244 - Poddar; Rakesh ;   et al. | 2012-03-08 |
Method of forming semiconductor devices in wafer assembly Grant 8,003,534 - Chand August 23, 2 | 2011-08-23 |
Method of forming semiconductor devices in wafer assembly App 20110092046 - Chand; Ami | 2011-04-21 |
Scanning probe devices and methods for fabricating same Grant 7,913,544 - Chand March 29, 2 | 2011-03-29 |
Semiconductor device in wafer assembly Grant 7,884,445 - Chand February 8, 2 | 2011-02-08 |
Probe For A Scanning Probe Microscope And Method Of Manufacture App 20080282819 - Kjoller; Kevin J. ;   et al. | 2008-11-20 |
Semiconductor device in wafer assembly App 20080116533 - Chand; Ami | 2008-05-22 |
Probes for use in scanning probe microscopes and methods of fabricating such probes Grant 7,370,515 - Okulan , et al. May 13, 2 | 2008-05-13 |
Method and apparatus of manipulating a sample Grant 7,334,460 - Chand , et al. February 26, 2 | 2008-02-26 |
Piezoresistive Cantilever Based Nanoflow And Viscosity Sensor For Microchannels App 20080011058 - Lal; Ratnesh ;   et al. | 2008-01-17 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby Grant 7,210,330 - Chand , et al. May 1, 2 | 2007-05-01 |
Methods Of Fabricating Structures For Characterizing Tip Shape Of Scanning Probe Microscope Probes And Structures Fabricated Thereby App 20060277972 - Chand; Ami ;   et al. | 2006-12-14 |
Method And Apparatus Of Manipulating A Sample App 20060243034 - Chand; Ami ;   et al. | 2006-11-02 |
Probe for a scanning probe microscope and method of manufacture App 20060213289 - Kjoller; Kevin J. ;   et al. | 2006-09-28 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby Grant 7,096,711 - Chand , et al. August 29, 2 | 2006-08-29 |
Method and apparatus for manipulating a sample Grant 7,040,147 - Chand , et al. May 9, 2 | 2006-05-09 |
Probes for use in scanning probe microscopes and methods of fabricating such probes App 20050279729 - Okulan, Nihat ;   et al. | 2005-12-22 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby App 20050252282 - Chand, Ami ;   et al. | 2005-11-17 |
Method and apparatus for manipulating a sample App 20050145021 - Chand, Ami ;   et al. | 2005-07-07 |
Method and apparatus for manipulating a sample Grant 6,862,921 - Chand , et al. March 8, 2 | 2005-03-08 |
Method and apparatus for manipulating a sample App 20020125427 - Chand, Ami ;   et al. | 2002-09-12 |
Microfabrication of cantilevers using sacrificial templates Grant 6,016,693 - Viani , et al. January 25, 2 | 2000-01-25 |