| Patent | Date |
|---|
Fault Criticality Assessment Using Graph Convolutional Networks
App 20220245439 - CHAKRABARTY; Krishnendu ; et al. | 2022-08-04 |
Evaluating Functional Fault Criticality Of Structural Faults For Circuit Testing
App 20220129732 - CHAKRABARTY; Krishnendu ; et al. | 2022-04-28 |
Efficient Identification Of Critical Faults In Neuromorphic Hardware Of A Neural Network
App 20220067531 - Chen; Ching-Yuan ; et al. | 2022-03-03 |
Online Fault Detection In Reram-based Ai/ml
App 20220066888 - Chakrabarty; Krishnendu ; et al. | 2022-03-03 |
Observation Point Injection For Integrated Circuit Testing
App 20220065926 - Chakrabarty; Krishnendu ; et al. | 2022-03-03 |
Variation-aware Delay Fault Testing
App 20220067250 - Chakrabarty; Krishnendu ; et al. | 2022-03-03 |
Software-based self-test and diagnosis using on-chip memory
Grant 10,845,416 - Deutsch , et al. November 24, 2 | 2020-11-24 |
Multi-layer integrated circuits having isolation cells for layer testing and related methods
Grant 10,838,003 - Chakrabarty , et al. November 17, 2 | 2020-11-17 |
Software-based self-test and diagnosis using on-chip memory
Grant 10,788,532 - Deutsch , et al. September 29, 2 | 2020-09-29 |
Testing monolithic three dimensional integrated circuits
Grant 10,775,429 - Kannan , et al. Sept | 2020-09-15 |
Signal tracing using on-chip memory for in-system post-fabrication debug
Grant 10,732,221 - Deutsch , et al. | 2020-08-04 |
Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels
Grant 10,444,279 - Chakrabarty , et al. Oc | 2019-10-15 |
Multi-layer Integrated Circuits Having Isolation Cells For Layer Testing And Related Methods
App 20190302179 - Chakrabarty; Krishnendu ; et al. | 2019-10-03 |
Multi-layer integrated circuits having isolation cells for layer testing and related methods
Grant 10,338,133 - Chakrabarty , et al. | 2019-07-02 |
Testing Monolithic Three Dimensional Integrated Circuits
App 20190094294 - Kannan; Sukeshwar ; et al. | 2019-03-28 |
Software-based Self-test And Diagnosis Using On-chip Memory
App 20180095129 - DEUTSCH; SERGEJ ; et al. | 2018-04-05 |
Software-based Self-test And Diagnosis Using On-chip Memory
App 20180095128 - DEUTSCH; SERGEJ ; et al. | 2018-04-05 |
Software-based self-test and diagnosis using on-chip memory
Grant 9,864,007 - Deutsch , et al. January 9, 2 | 2018-01-09 |
Multi-layer Integrated Circuits Having Isolation Cells For Layer Testing And Related Methods
App 20170343603 - Chakrabarty; Krishnendu ; et al. | 2017-11-30 |
Signal Tracing Using On-chip Memory For In-system Post-fabrication Debug
App 20170299655 - DEUTSCH; SERGEJ ; et al. | 2017-10-19 |
Signal tracing using on-chip memory for in-system post-fabrication debug
Grant 9,720,036 - Deutsch , et al. August 1, 2 | 2017-08-01 |
Non-invasive Pre-bond Tsv Using Ring Oscillators And Multiple Voltage Levels
App 20170003340 - CHAKRABARTY; KRISHNENDU ; et al. | 2017-01-05 |
Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels
Grant 9,482,720 - Chakrabarty , et al. November 1, 2 | 2016-11-01 |
Print production scheduling
Grant 9,367,268 - Zeng , et al. June 14, 2 | 2016-06-14 |
Signal Tracing Using On-chip Memory For In-system Post-fabrication Debug
App 20160047859 - DEUTSCH; SERGEJ ; et al. | 2016-02-18 |
Architectural layout for dilution with reduced wastage in digital microfluidic based lab-on-a-chip
Grant 9,201,042 - Bhattacharya , et al. December 1, 2 | 2015-12-01 |
Software-based Self-test And Diagnosis Using On-chip Memory
App 20150316605 - Deutsch; Sergej ; et al. | 2015-11-05 |
High throughput and volumetric error resilient dilution with digital microfluidic based lab-on-a-chip
Grant 9,128,014 - Bhattacharya , et al. September 8, 2 | 2015-09-08 |
Print Production Scheduling
App 20150098110 - Zeng; Jun ; et al. | 2015-04-09 |
Retiming-based design flow for delay recovery on inter-die paths in 3D ICs
Grant 8,832,608 - Chakrabarty , et al. September 9, 2 | 2014-09-09 |
Non-invasive Pre-bond Tsv Test Using Ring Oscillators And Multiple Voltage Levels
App 20140225624 - CHAKRABARTY; KRISHNENDU ; et al. | 2014-08-14 |
Scan test of die logic in 3D ICs using TSV probing
Grant 8,782,479 - Chakrabarty , et al. July 15, 2 | 2014-07-15 |
Method and architecture for pre-bond probing of TSVs in 3D stacked integrated circuits
Grant 8,775,108 - Chakrabarty , et al. July 8, 2 | 2014-07-08 |
Validating Feasibility of Proposed Contract Provisions
App 20140136268 - Zeng; Jun ; et al. | 2014-05-15 |
SCAN TEST OF DIE LOGIC IN 3D ICs USING TSV PROBING
App 20140122951 - Chakrabarty; Krishnendu ; et al. | 2014-05-01 |
Dilution Method For Digital Microfluidic Biochips
App 20130115703 - Bhattacharya; Bhargab B. ; et al. | 2013-05-09 |
Architectural Layout For Dilution With Reduced Wastage In Digital Microfluidic Based Lab-on-a-chip
App 20130105319 - Bhattacharya; Bhargab B. ; et al. | 2013-05-02 |
High Throughput And Volumetric Error Resilient Dilution With Digital Microfluidic Based Lab-on-a-chip
App 20130105318 - Bhattacharya; Bhargab B. ; et al. | 2013-05-02 |
Power switch design and method for reducing leakage power in low-power integrated circuits
Grant 8,373,493 - Chakrabarty , et al. February 12, 2 | 2013-02-12 |
METHOD AND ARCHITECTURE FOR PRE-BOND PROBING OF TSVs IN 3D STACKED INTEGRATED CIRCUITS
App 20130006557 - Chakrabarty; Krishnendu ; et al. | 2013-01-03 |
Power Switch Design And Method For Reducing Leakage Power In Low-power Integrated Circuits
App 20120062308 - CHAKRABARTY; KRISHNENDU ; et al. | 2012-03-15 |
Droplet Actuators, Systems and Methods
App 20100236929 - Pollack; Michael G. ; et al. | 2010-09-23 |
Self-organizing sensor node network
App 20060253570 - Biswas; Pratik ; et al. | 2006-11-09 |
Circuit with built-in test and method thereof
Grant 5,790,562 - Murray , et al. August 4, 1 | 1998-08-04 |
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