loadpatents
name:-0.0080938339233398
name:-0.0063090324401855
name:-0.00036215782165527
Chae; Hyo-geun Patent Filings

Chae; Hyo-geun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Chae; Hyo-geun.The latest application filed is for "test kit for semiconductor package and method for testing semiconductor package using the same".

Company Profile
0.4.6
  • Chae; Hyo-geun - Seoul KR
  • Chae; Hyo-geun - Chungcheongnam-do KR
  • Chae; Hyo-geun - Ahsan KR
  • Chae, Hyo-geun - Ahsan-city KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Test kit for semiconductor package and method for testing semiconductor package using the same
Grant 7,017,428 - Min , et al. March 28, 2
2006-03-28
Wafer treatment method for protecting fuse box of semiconductor chip
Grant 6,841,425 - Lee , et al. January 11, 2
2005-01-11
Test kit for semiconductor package and method for testing semiconductor package using the same
App 20040112142 - Min, Byoung-Jun ;   et al.
2004-06-17
Wafer treatment method for protecting fuse box of semiconductor chip
App 20030080360 - Lee, Jae-Il ;   et al.
2003-05-01
Socket including pressure conductive rubber and mesh for testing of ball grid array package
Grant 6,489,790 - An , et al. December 3, 2
2002-12-03
Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
Grant 6,462,534 - Kang , et al. October 8, 2
2002-10-08
Method and apparatus for detecting defective markings on a semiconductor product
App 20020092910 - Lim, Sung-Muk ;   et al.
2002-07-18
Socket, Circuit Board, And Sub-circuit Board For Semiconductor Integrated Circuit Device
App 20020037672 - MIN, BYOUNG JUN ;   et al.
2002-03-28
Socket Pin And Socket For Electrical Testing Of Semiconductor Packages
App 20020011864 - AN, YOUNG-SOO ;   et al.
2002-01-31
Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
App 20010026152 - Kang, Seong-goo ;   et al.
2001-10-04

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