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Patent applications and USPTO patent grants for Chacon; Carlos M..The latest application filed is for "structure for oxide/silicon nitride interface substructure improvements".
Patent | Date |
---|---|
Non-contact method for determining quality of semiconductor dielectrics Grant 6,664,800 - Chacon , et al. December 16, 2 | 2003-12-16 |
Structure for oxide/silicon nitride interface substructure improvements App 20030186499 - Roy, Pradip K. ;   et al. | 2003-10-02 |
Method And Structure For Oxide/silicon Nitride Interface Substructure Improvements App 20030060058 - Roy, Pradip K. ;   et al. | 2003-03-27 |
Non-contact method for determining soft breakdown in dielectrics App 20020121914 - Chacon, Carlos M. ;   et al. | 2002-09-05 |
Method of determining a trap density of a semiconductor/oxide interface by a contactless charge technique Grant 6,391,668 - Chacon , et al. May 21, 2 | 2002-05-21 |
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