Patent | Date |
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Method to fabricate horizontal air columns underneath metal inductor Grant 7,573,081 - Chan , et al. August 11, 2 | 2009-08-11 |
Method to fabricate horizontal air columns underneath metal inductor App 20070007623 - Chan; Lap ;   et al. | 2007-01-11 |
Method to form a cross network of air gaps within IMD layer Grant 7,112,866 - Chan , et al. September 26, 2 | 2006-09-26 |
Method to fabricate horizontal air columns underneath metal inductor Grant 7,105,420 - Chan , et al. September 12, 2 | 2006-09-12 |
Method to form a cross network of air gaps within IMD layer App 20040175896 - Chan, Lap ;   et al. | 2004-09-09 |
Method to form a cross network of air gaps within IMD layer Grant 6,730,571 - Chan , et al. May 4, 2 | 2004-05-04 |
Effective isolation with high aspect ratio shallow trench isolation and oxygen or field implant Grant 6,680,239 - Cha , et al. January 20, 2 | 2004-01-20 |
Forming dual gate oxide thickness on vertical transistors by ion implantation Grant 6,610,575 - Ang , et al. August 26, 2 | 2003-08-26 |
Method of fabricating CMOS device with dual gate electrode Grant 6,605,501 - Ang , et al. August 12, 2 | 2003-08-12 |
Flash device having a large planar area ono interpoly dielectric Grant 6,501,122 - Chan , et al. December 31, 2 | 2002-12-31 |
Self-aligned elevated transistor App 20020090787 - Chan, Lap ;   et al. | 2002-07-11 |
Method to form high performance copper damascene interconnects by de-coupling via and metal line filling Grant 6,380,084 - Lim , et al. April 30, 2 | 2002-04-30 |
Method to form shallow junction transistors while eliminating shorts due to junction spiking App 20020011629 - Chan, Lap ;   et al. | 2002-01-31 |
Method to form shallow junction transistors while eliminating shorts due to junction spiking App 20020003264 - Chan, Lap ;   et al. | 2002-01-10 |
Method of fabricating CMOS devices featuring dual gate structures and a high dielectric constant gate insulator layer Grant 6,303,418 - Cha , et al. October 16, 2 | 2001-10-16 |
Method to form shallow junction transistors while eliminating shorts due to junction spiking Grant 6,297,109 - Chan , et al. October 2, 2 | 2001-10-02 |
Embedded polysilicon gate MOSFET Grant 6,252,277 - Chan , et al. June 26, 2 | 2001-06-26 |
Method to trap air at the silicon substrate for improving the quality factor of RF inductors in CMOS technology Grant 6,221,727 - Chan , et al. April 24, 2 | 2001-04-24 |
Formation of low k dielectric Grant 6,150,232 - Chan , et al. November 21, 2 | 2000-11-21 |
Method of making spiral-type RF inductors having a high quality factor (Q) Grant 6,140,197 - Chu , et al. October 31, 2 | 2000-10-31 |
Production of reversed flash memory device Grant 6,096,604 - Cha , et al. August 1, 2 | 2000-08-01 |