Cemic; Franz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cemic; Franz.The latest application filed is for "device and method for inspecting an object".

Company Profile

0.5.6

Cemic; Franz - Weilmunster DE
Cemic; Franz - Weilmuenster DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Device and method for inspecting an object Grant 7,271,889 - Cemic , et al. September 18, 2	2007-09-18
Illumination device, and coordinate measuring instrument having an illumination device Grant 7,209,243 - Cemic , et al. April 24, 2	2007-04-24
Illumination device; and coordinate measuring instrument having an illumination device Grant 6,975,409 - Cemic , et al. December 13, 2	2005-12-13
Device and method for inspecting an object App 20050259245 - Cemic, Franz ; et al.	2005-11-24
Critical dimension measuring instrument Grant 6,943,901 - Cemic , et al. September 13, 2	2005-09-13
Autofocus module and method for a microscope-based system Grant 6,879,440 - Cemic , et al. April 12, 2	2005-04-12
Illumination device, and coordinate measuring instrument having an illumination device App 20040160777 - Cemic, Franz ; et al.	2004-08-19
Method and microscope for detecting images of an object App 20040120579 - Cemic, Franz ; et al.	2004-06-24
Critical dimension measuring instrument App 20040070821 - Cemic, Franz ; et al.	2004-04-15
Autofocus module and method for a microscope-based system App 20030147134 - Cemic, Franz ; et al.	2003-08-07
Illumination device; and coordinate measuring instrument having an illumination device App 20020001090 - Cemic, Franz ; et al.	2002-01-03

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