Celii; Francis Gabriel
Patent Applications and Registrations
Patent applications and USPTO patent grants for Celii; Francis Gabriel.The latest application filed is for "hardmask manufacture in ferroelectric capacitors".
- Celii; Francis Gabriel - Dallas TX
| Patent | Date |
|---|---|
| Method for leakage reduction in fabrication of high-density FRAM arrays Grant 8,093,070 - Celii , et al. January 10, 2 | 2012-01-10 |
| Ferroelectric capacitor manufacturing process Grant 7,985,603 - Celii , et al. July 26, 2 | 2011-07-26 |
| Hardmask manufacture in ferroelectric capacitors Grant 7,811,882 - Celii October 12, 2 | 2010-10-12 |
| Hardmask Manufacture In Ferroelectric Capacitors App 20100176427 - Celii; Francis Gabriel | 2010-07-15 |
| Method for cleaning post-etch noble metal residues Grant 7,723,199 - Obeng , et al. May 25, 2 | 2010-05-25 |
| Ferroelectric Capacitor Manufacturing Process App 20090194801 - Celii; Francis Gabriel ; et al. | 2009-08-06 |
| Method for leakage reduction in fabrication of high-density FRAM arrays App 20080081380 - Celii; Francis Gabriel ; et al. | 2008-04-03 |
| Method For Cleaning Post-etch Noble Metal Residues App 20070298521 - Obeng; Yaw S. ; et al. | 2007-12-27 |
| Gate patterning method for semiconductor processing App 20070119813 - Celii; Francis Gabriel ; et al. | 2007-05-31 |
| Method and system for qualifying a semiconductor etch process App 20060186406 - Bushman; Scott Gregory ; et al. | 2006-08-24 |
| VIA0 etch process for FRAM integration Grant 6,841,396 - Celii , et al. January 11, 2 | 2005-01-11 |
| Via0 Etch Process For Fram Integration App 20040235259 - Celii, Francis Gabriel ; et al. | 2004-11-25 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 