Carl Zeiss SMT Inc.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Carl Zeiss SMT Inc..The latest application filed is for "method for imaging a region of interest of a sample using a tomographic x-ray microscope, microscope, system and computer program".
- Carl Zeiss SMT Inc. - Pleasanton CA US
- Carl Zeiss SMT Inc. - Peabody MA
| Patent | Date |
|---|---|
| Method and devices for determining metrology sites Grant 11,436,506 - Srikantha , et al. September 6, 2 | 2022-09-06 |
| Sample Holder, System And Method App 20210404977 - Case; Thomas Anthony ; et al. | 2021-12-30 |
| Method For Imaging A Region Of Interest Of A Sample Using A Tomographic X-ray Microscope, Microscope, System And Computer Program App 20210407127 - Case; Thomas Anthony ; et al. | 2021-12-30 |
| Method And Devices For Determining Metrology Sites App 20200285976 - Srikantha; Abhilash ; et al. | 2020-09-10 |
| Reducing Particle Implantation App 20110049364 - Knippelmeyer; Rainer ; et al. | 2011-03-03 |
| Gas Field Ion Source With Coated Tip App 20110001058 - Notte, IV; John A. | 2011-01-06 |
| Ice Layers In Charged Particle Systems And Methods App 20100136255 - Notte, IV; John A. ; et al. | 2010-06-03 |
| Ion Beam Stabilization App 20100051805 - Rahman; FHM-Faridur ; et al. | 2010-03-04 |
| Repairing Defects App 20100052697 - Knippelmeyer; Rainer ; et al. | 2010-03-04 |
| Increasing Current In Charged Particle Sources And Systems App 20100012839 - Notte, IV; John A. ; et al. | 2010-01-21 |
| Multiple Current Charged Particle Methods App 20100012837 - Notte, IV; John A. ; et al. | 2010-01-21 |
| Sample Decontamination App 20090314939 - Stern; Lewis A. ; et al. | 2009-12-24 |
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