Carl Zeiss Microscopy Ltd.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Carl Zeiss Microscopy Ltd..The latest application filed is for "charged particle beam system and method".

Company Profile

4.20.7

Carl Zeiss Microscopy Ltd. - Cambridge GB
Carl Zeiss Microscopy Limited - Cambridge Cambridgeshire GB

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and data analysis system for semi-automated particle analysis using a charged particle beam Grant 10,955,368 - Gohil , et al. March 23, 2	2021-03-23
Charged particle beam system and method Grant 10,854,421 - Donhauser , et al. December 1, 2	2020-12-01
Charged Particle Beam System And Method App 20190304743 - Donhauser; Daniela ; et al.	2019-10-03
Detecting charged particles Grant 10,049,855 - Guerra August 14, 2	2018-08-14
Method of operating a charged particle microscope and charged particle microscope operating according to such method Grant 9,916,964 - Diemer , et al. March 13, 2	2018-03-13
Method and system for performing EDS analysis Grant 9,726,625 - Hill August 8, 2	2017-08-08
Detecting Charged Particles App 20170162364 - Guerra; Diego	2017-06-08
Method for analyzing an object and charged particle beam device for carrying out the method Grant 9,620,331 - Bhattiprolu , et al. April 11, 2	2017-04-11
Method of operating a charged particle microscope and charged particle microscope operating according to such method Grant 9,437,394 - Diemer , et al. September 6, 2	2016-09-06
Method And System For Performing Eds Analysis App 20160061754 - Hill; Edward	2016-03-03
Method of analyzing a sample and charged particle beam device for analyzing a sample Grant 9,159,532 - Hill , et al. October 13, 2	2015-10-13
Method And Data Analysis System For Semi-automated Particle Analysis Using A Charged Particle Beam App 20150046097 - Gohil; Champ ; et al.	2015-02-12
Electron gun used in particle beam device Grant 8,890,444 - Hayn , et al. November 18, 2	2014-11-18
Method Of Analyzing A Sample And Charged Particle Beam Device For Analyzing A Sample App 20140197310 - Hill; Edward ; et al.	2014-07-17
Particle beam system having a hollow light guide Grant 8,648,301 - Bean , et al. February 11, 2	2014-02-11
Microscope system, method for operating a charged-particle microscope Grant 8,426,812 - Bean , et al. April 23, 2	2013-04-23
Particle Beam System Having A Hollow Light Guide App 20130075604 - Bean; Stewart ; et al.	2013-03-28

Company Registrations

NCAGE Code	U0NW6	CARL ZEISS MICROSCOPY LIMITED
CAGE Code	U0NW6	CARL ZEISS MICROSCOPY LIMITED

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