Patent | Date |
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Probe for testing an electrical property of a test sample Grant 11,215,638 - Shiv January 4, 2 | 2022-01-04 |
Position correction method and a system for position correction in relation to four probe resistance measurements Grant 11,131,700 - Osterberg , et al. September 28, 2 | 2021-09-28 |
Probe For Testing An Electrical Property Of A Test Sample App 20200278380 - Osterberg; Frederik Westergaard ;   et al. | 2020-09-03 |
A Probe For Testing An Electrical Property Of A Test Sample App 20200241043 - Shiv; Lior | 2020-07-30 |
A Position Correction Method And A System For Position Correction In Relation To Four Probe Resistance Measurements App 20190310295 - Osterberg; Frederik Westergaard ;   et al. | 2019-10-10 |
Deep-etched multipoint probe Grant 9,983,231 - Shiv May 29, 2 | 2018-05-29 |
Single-position hall effect measurements Grant 9,644,939 - Wang , et al. May 9, 2 | 2017-05-09 |
Deep-etched Multipoint Probe App 20150177278 - Shiv; Lior | 2015-06-25 |
Method of determining an electrical property of a test sample Grant 8,907,690 - Petersen , et al. December 9, 2 | 2014-12-09 |
Rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder Grant D717,190 - Jochumsen , et al. November 11, 2 | 2014-11-11 |
Rack for supporting a multi-point electrical probe holder Grant D717,188 - Jochumsen , et al. November 11, 2 | 2014-11-11 |
Cover, connector, and handle assembly attachable to a rack for a rack-supported multi-point electrical probe holder Grant D717,189 - Jochumsen , et al. November 11, 2 | 2014-11-11 |
Automated multi-point probe manipulation Grant 8,836,358 - Baekbo , et al. September 16, 2 | 2014-09-16 |
Single-position Hall Effect Measurements App 20140015552 - Wang; Fei ;   et al. | 2014-01-16 |
Method for providing alignment of a probe Grant 8,378,697 - Nielsen , et al. February 19, 2 | 2013-02-19 |
Probe for testing electrical properties of a test sample Grant 8,310,258 - Petersen , et al. November 13, 2 | 2012-11-13 |
Method For Sheet Resistance And Leakage Current Density Measurements On Shallow Semiconductor Implants App 20120143545 - Petersen; Christian L. | 2012-06-07 |
Method For Sheet Resistance And Leakage Current Density Measurements On Shallow Semiconductor Implants App 20110320144 - Petersen; Christian L. | 2011-12-29 |
Device including a contact detector Grant 8,058,886 - Petersen , et al. November 15, 2 | 2011-11-15 |
Eliminating inline positional errors for four-point resistance measurement Grant 7,944,222 - Hansen May 17, 2 | 2011-05-17 |
Method for providing alignment of a probe Grant 7,936,176 - Nielsen , et al. May 3, 2 | 2011-05-03 |
Eliminating inline positional errors for four-point resistance measurement Grant 7,852,093 - Hansen December 14, 2 | 2010-12-14 |
Connector for a microchip probe Grant D602,885 - Nielsen October 27, 2 | 2009-10-27 |
Probe For Testing Electrical Properties Of A Test Sample App 20090219047 - Petersen; Dirch ;   et al. | 2009-09-03 |
Method for Providing Alignment of a Probe App 20090009200 - Nielsen; Peter Folmer ;   et al. | 2009-01-08 |
Eliminating Inline Positional Errors for Four-Point Resistance Measurement App 20080294365 - Hansen; Torben M. | 2008-11-27 |
Electrical feedback detection system for multi-point probes Grant 7,307,436 - Petersen , et al. December 11, 2 | 2007-12-11 |
Nano-drive for high resolution positioning and for positioning of a multi-point probe Grant 7,304,486 - Petersen , et al. December 4, 2 | 2007-12-04 |
Electrical feedback detection system for multi-point probes Grant 7,135,876 - Petersen , et al. November 14, 2 | 2006-11-14 |