loadpatents
name:-0.032052040100098
name:-0.031867027282715
name:-0.0016539096832275
Cannon; Ethan H. Patent Filings

Cannon; Ethan H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cannon; Ethan H..The latest application filed is for "radiation hardened flip-flop circuit for mitigating single event transients".

Company Profile
1.32.29
  • Cannon; Ethan H. - Seattle WA
  • Cannon; Ethan H. - Issaquah WA
  • Cannon; Ethan H. - Sammamish WA
  • Cannon; Ethan H. - Essex Junction VT US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Radiation Hardened Flip-flop Circuit For Mitigating Single Event Transients
App 20220200585 - Rabaa; Salim A. ;   et al.
2022-06-23
Direct measurement test structures for measuring static random access memory static noise margin
Grant 11,029,355 - Yao , et al. June 8, 2
2021-06-08
Direct Measurement Test Structures For Measuring Static Random Access Memory Static Noise Margin
App 20200319243 - Yao; Mark ;   et al.
2020-10-08
Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation
Grant 9,223,037 - Cannon , et al. December 29, 2
2015-12-29
In-line stacking of transistors for soft error rate hardening
Grant 9,165,917 - Cannon , et al. October 20, 2
2015-10-20
Array of alpha particle sensors
Grant 8,647,909 - Cannon , et al. February 11, 2
2014-02-11
Structure And Method To Ensure Correct Operation Of An Integrated Circuit In The Presence Of Ionizing Radiation
App 20140032135 - CANNON; ETHAN H. ;   et al.
2014-01-30
Apparatus and method for hardening latches in SOI CMOS devices
Grant 8,354,858 - Cannon , et al. January 15, 2
2013-01-15
Structure and method for improving storage latch susceptibility to single event upsets
Grant 8,300,452 - Cannon , et al. October 30, 2
2012-10-30
Method and apparatus for reducing radiation and cross-talk induced data errors
Grant 8,207,753 - Cabanas-Holmen , et al. June 26, 2
2012-06-26
Array Of Alpha Particle Sensors
App 20120122260 - Cannon; Ethan H. ;   et al.
2012-05-17
On-chip heater and methods for fabrication thereof and use thereof
Grant 8,138,573 - Cannon , et al. March 20, 2
2012-03-20
Deep trench capacitor for SOI CMOS devices for soft error immunity
Grant 8,133,772 - Barth, Jr. , et al. March 13, 2
2012-03-13
Array of alpha particle sensors
Grant 8,120,131 - Cannon , et al. February 21, 2
2012-02-21
Method And Apparatus For Reducing Radiation And Cross-talk Induced Data Errors
App 20110309856 - Cabanas-Holmen; Manuel F. ;   et al.
2011-12-22
Method and apparatus for reducing radiation and cross-talk induced data errors
Grant 8,054,099 - Cabanas-Holmen , et al. November 8, 2
2011-11-08
Deep Trench Capacitor For Soi Cmos Devices For Soft Error Immunity
App 20110177660 - Barth, JR.; John E. ;   et al.
2011-07-21
Structure And Method For Improving Storage Latch Susceptibility To Single Event Upsets
App 20110163365 - Cannon; Ethan H. ;   et al.
2011-07-07
Structure and method for improving storage latch susceptibility to single event upsets
Grant 7,965,540 - Cannon , et al. June 21, 2
2011-06-21
Method for semiconductor device having radiation hardened insulators and design structure thereof
Grant 7,943,482 - Aitken , et al. May 17, 2
2011-05-17
Apparatus And Method For Hardening Latches In Soi Cmos Devices
App 20110102042 - Cannon; Ethan H. ;   et al.
2011-05-05
Method for fabricating semiconductor device having radiation hardened insulators
Grant 7,935,609 - Aitken , et al. May 3, 2
2011-05-03
Apparatus and method for hardening latches in SOI CMOS devices
Grant 7,888,959 - Cannon , et al. February 15, 2
2011-02-15
Method And Apparatus For Reducing Radiation And Cross-talk Induced Data Errors
App 20110025372 - Cabanas-Holmen; Manuel F. ;   et al.
2011-02-03
Method for Q.sub.CRIT measurement in bulk CMOS using a switched capacitor circuit
Grant 7,881,135 - Cannon , et al. February 1, 2
2011-02-01
Design structure for alpha particle sensor in SOI technology and structure thereof
Grant 7,875,854 - Cannon , et al. January 25, 2
2011-01-25
In-line Stacking Of Transistors For Soft Error Rate Hardening
App 20100301446 - Cannon; Ethan H. ;   et al.
2010-12-02
Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacitor Circuit
App 20100271057 - Cannon; Ethan H. ;   et al.
2010-10-28
Array Of Alpha Particle Sensors
App 20100230772 - Cannon; Ethan H. ;   et al.
2010-09-16
Device structures with a self-aligned damage layer and methods for forming such device structures
Grant 7,795,679 - Cannon , et al. September 14, 2
2010-09-14
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
Grant 7,791,169 - Aitken , et al. September 7, 2
2010-09-07
Soft error protection structure employing a deep trench
Grant 7,791,123 - Cannon , et al. September 7, 2
2010-09-07
On-chip Heater And Methods For Fabrication Thereof And Use Thereof
App 20100200953 - Cannon; Ethan H. ;   et al.
2010-08-12
CMOS storage devices configurable in high performance mode or radiation tolerant mode
Grant 7,719,887 - Cannon , et al. May 18, 2
2010-05-18
On-chip heater and methods for fabrication thereof and use thereof
Grant 7,704,847 - Cannon , et al. April 27, 2
2010-04-27
Method For Fabricating Semiconductor Device Having Radiation Hardened Insulators
App 20100035393 - Aitken; John M. ;   et al.
2010-02-11
Design Structure For Semiconductor Device Having Radiation Hardened Insulators And Structure Thereof
App 20100032795 - AITKEN; John M. ;   et al.
2010-02-11
Device Structures With A Self-aligned Damage Layer And Methods For Forming Such Device Structures
App 20100019330 - Cannon; Ethan H. ;   et al.
2010-01-28
Design Structure For Alpha Particle Sensor In Soi Technology And Structure Thereof
App 20090250622 - CANNON; Ethan H. ;   et al.
2009-10-08
Structure And Method For Improving Storage Latch Susceptibility To Single Event Upsets
App 20090244954 - Cannon; Ethan H. ;   et al.
2009-10-01
Soft Error Protection Structure Employing A Deep Trench
App 20090224304 - Cannon; Ethan H. ;   et al.
2009-09-10
Method for detecting alpha particles in SOI technology
Grant 7,550,730 - Cannon , et al. June 23, 2
2009-06-23
Apparatus And Method For Hardening Latches In Soi Cmos Devices
App 20090134925 - Cannon; Ethan H. ;   et al.
2009-05-28
Soft error reduction of CMOS circuits on substrates with hybrid crystal orientation using buried recombination centers
Grant 7,521,776 - Cannon , et al. April 21, 2
2009-04-21
Cmos Storage Devices Configurable In High Performance Mode Or Radiation Tolerant Mode
App 20090059657 - Cannon; Ethan H. ;   et al.
2009-03-05
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors
App 20080191314 - Aitken; John M. ;   et al.
2008-08-14
Soft Error Reduction Of Cmos Circuits On Substrates With Hybrid Crystal Orientation Using Buried Recombination Centers
App 20080157202 - Cannon; Ethan H. ;   et al.
2008-07-03
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
Grant 7,388,274 - Aitken , et al. June 17, 2
2008-06-17
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors
Grant 7,315,075 - Aitken , et al. January 1, 2
2008-01-01
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors
App 20070272961 - Aitken; John M. ;   et al.
2007-11-29
On-chip Heater And Methods For Fabrication Thereof And Use Thereof
App 20070268736 - Cannon; Ethan H. ;   et al.
2007-11-22
Automatic exchange of degraders in accelerated testing of computer chips
Grant 7,183,758 - Bohnenkamp , et al. February 27, 2
2007-02-27
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors
App 20060163635 - Aitken; John M. ;   et al.
2006-07-27
Heater for annealing trapped charge in a semiconductor device
Grant 7,064,414 - Aitken , et al. June 20, 2
2006-06-20
Heater For Annealing Trapped Charge In A Semiconductor Device
App 20060103007 - Aitken; John M. ;   et al.
2006-05-18
Automatic exchange of degraders in accelerated testing of computer chips
App 20050143945 - Bohnenkamp, Carl E. ;   et al.
2005-06-30

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