Patent | Date |
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Radiation Hardened Flip-flop Circuit For Mitigating Single Event Transients App 20220200585 - Rabaa; Salim A. ;   et al. | 2022-06-23 |
Direct measurement test structures for measuring static random access memory static noise margin Grant 11,029,355 - Yao , et al. June 8, 2 | 2021-06-08 |
Direct Measurement Test Structures For Measuring Static Random Access Memory Static Noise Margin App 20200319243 - Yao; Mark ;   et al. | 2020-10-08 |
Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation Grant 9,223,037 - Cannon , et al. December 29, 2 | 2015-12-29 |
In-line stacking of transistors for soft error rate hardening Grant 9,165,917 - Cannon , et al. October 20, 2 | 2015-10-20 |
Array of alpha particle sensors Grant 8,647,909 - Cannon , et al. February 11, 2 | 2014-02-11 |
Structure And Method To Ensure Correct Operation Of An Integrated Circuit In The Presence Of Ionizing Radiation App 20140032135 - CANNON; ETHAN H. ;   et al. | 2014-01-30 |
Apparatus and method for hardening latches in SOI CMOS devices Grant 8,354,858 - Cannon , et al. January 15, 2 | 2013-01-15 |
Structure and method for improving storage latch susceptibility to single event upsets Grant 8,300,452 - Cannon , et al. October 30, 2 | 2012-10-30 |
Method and apparatus for reducing radiation and cross-talk induced data errors Grant 8,207,753 - Cabanas-Holmen , et al. June 26, 2 | 2012-06-26 |
Array Of Alpha Particle Sensors App 20120122260 - Cannon; Ethan H. ;   et al. | 2012-05-17 |
On-chip heater and methods for fabrication thereof and use thereof Grant 8,138,573 - Cannon , et al. March 20, 2 | 2012-03-20 |
Deep trench capacitor for SOI CMOS devices for soft error immunity Grant 8,133,772 - Barth, Jr. , et al. March 13, 2 | 2012-03-13 |
Array of alpha particle sensors Grant 8,120,131 - Cannon , et al. February 21, 2 | 2012-02-21 |
Method And Apparatus For Reducing Radiation And Cross-talk Induced Data Errors App 20110309856 - Cabanas-Holmen; Manuel F. ;   et al. | 2011-12-22 |
Method and apparatus for reducing radiation and cross-talk induced data errors Grant 8,054,099 - Cabanas-Holmen , et al. November 8, 2 | 2011-11-08 |
Deep Trench Capacitor For Soi Cmos Devices For Soft Error Immunity App 20110177660 - Barth, JR.; John E. ;   et al. | 2011-07-21 |
Structure And Method For Improving Storage Latch Susceptibility To Single Event Upsets App 20110163365 - Cannon; Ethan H. ;   et al. | 2011-07-07 |
Structure and method for improving storage latch susceptibility to single event upsets Grant 7,965,540 - Cannon , et al. June 21, 2 | 2011-06-21 |
Method for semiconductor device having radiation hardened insulators and design structure thereof Grant 7,943,482 - Aitken , et al. May 17, 2 | 2011-05-17 |
Apparatus And Method For Hardening Latches In Soi Cmos Devices App 20110102042 - Cannon; Ethan H. ;   et al. | 2011-05-05 |
Method for fabricating semiconductor device having radiation hardened insulators Grant 7,935,609 - Aitken , et al. May 3, 2 | 2011-05-03 |
Apparatus and method for hardening latches in SOI CMOS devices Grant 7,888,959 - Cannon , et al. February 15, 2 | 2011-02-15 |
Method And Apparatus For Reducing Radiation And Cross-talk Induced Data Errors App 20110025372 - Cabanas-Holmen; Manuel F. ;   et al. | 2011-02-03 |
Method for Q.sub.CRIT measurement in bulk CMOS using a switched capacitor circuit Grant 7,881,135 - Cannon , et al. February 1, 2 | 2011-02-01 |
Design structure for alpha particle sensor in SOI technology and structure thereof Grant 7,875,854 - Cannon , et al. January 25, 2 | 2011-01-25 |
In-line Stacking Of Transistors For Soft Error Rate Hardening App 20100301446 - Cannon; Ethan H. ;   et al. | 2010-12-02 |
Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacitor Circuit App 20100271057 - Cannon; Ethan H. ;   et al. | 2010-10-28 |
Array Of Alpha Particle Sensors App 20100230772 - Cannon; Ethan H. ;   et al. | 2010-09-16 |
Device structures with a self-aligned damage layer and methods for forming such device structures Grant 7,795,679 - Cannon , et al. September 14, 2 | 2010-09-14 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors Grant 7,791,169 - Aitken , et al. September 7, 2 | 2010-09-07 |
Soft error protection structure employing a deep trench Grant 7,791,123 - Cannon , et al. September 7, 2 | 2010-09-07 |
On-chip Heater And Methods For Fabrication Thereof And Use Thereof App 20100200953 - Cannon; Ethan H. ;   et al. | 2010-08-12 |
CMOS storage devices configurable in high performance mode or radiation tolerant mode Grant 7,719,887 - Cannon , et al. May 18, 2 | 2010-05-18 |
On-chip heater and methods for fabrication thereof and use thereof Grant 7,704,847 - Cannon , et al. April 27, 2 | 2010-04-27 |
Method For Fabricating Semiconductor Device Having Radiation Hardened Insulators App 20100035393 - Aitken; John M. ;   et al. | 2010-02-11 |
Design Structure For Semiconductor Device Having Radiation Hardened Insulators And Structure Thereof App 20100032795 - AITKEN; John M. ;   et al. | 2010-02-11 |
Device Structures With A Self-aligned Damage Layer And Methods For Forming Such Device Structures App 20100019330 - Cannon; Ethan H. ;   et al. | 2010-01-28 |
Design Structure For Alpha Particle Sensor In Soi Technology And Structure Thereof App 20090250622 - CANNON; Ethan H. ;   et al. | 2009-10-08 |
Structure And Method For Improving Storage Latch Susceptibility To Single Event Upsets App 20090244954 - Cannon; Ethan H. ;   et al. | 2009-10-01 |
Soft Error Protection Structure Employing A Deep Trench App 20090224304 - Cannon; Ethan H. ;   et al. | 2009-09-10 |
Method for detecting alpha particles in SOI technology Grant 7,550,730 - Cannon , et al. June 23, 2 | 2009-06-23 |
Apparatus And Method For Hardening Latches In Soi Cmos Devices App 20090134925 - Cannon; Ethan H. ;   et al. | 2009-05-28 |
Soft error reduction of CMOS circuits on substrates with hybrid crystal orientation using buried recombination centers Grant 7,521,776 - Cannon , et al. April 21, 2 | 2009-04-21 |
Cmos Storage Devices Configurable In High Performance Mode Or Radiation Tolerant Mode App 20090059657 - Cannon; Ethan H. ;   et al. | 2009-03-05 |
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors App 20080191314 - Aitken; John M. ;   et al. | 2008-08-14 |
Soft Error Reduction Of Cmos Circuits On Substrates With Hybrid Crystal Orientation Using Buried Recombination Centers App 20080157202 - Cannon; Ethan H. ;   et al. | 2008-07-03 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors Grant 7,388,274 - Aitken , et al. June 17, 2 | 2008-06-17 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors Grant 7,315,075 - Aitken , et al. January 1, 2 | 2008-01-01 |
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors App 20070272961 - Aitken; John M. ;   et al. | 2007-11-29 |
On-chip Heater And Methods For Fabrication Thereof And Use Thereof App 20070268736 - Cannon; Ethan H. ;   et al. | 2007-11-22 |
Automatic exchange of degraders in accelerated testing of computer chips Grant 7,183,758 - Bohnenkamp , et al. February 27, 2 | 2007-02-27 |
Capacitor Below The Buried Oxide Of Soi Cmos Technologies For Protection Against Soft Errors App 20060163635 - Aitken; John M. ;   et al. | 2006-07-27 |
Heater for annealing trapped charge in a semiconductor device Grant 7,064,414 - Aitken , et al. June 20, 2 | 2006-06-20 |
Heater For Annealing Trapped Charge In A Semiconductor Device App 20060103007 - Aitken; John M. ;   et al. | 2006-05-18 |
Automatic exchange of degraders in accelerated testing of computer chips App 20050143945 - Bohnenkamp, Carl E. ;   et al. | 2005-06-30 |