Campbell; Shannon Roy

Patent Applications and Registrations

Patent applications and USPTO patent grants for Campbell; Shannon Roy.The latest application filed is for "metrology system with projected pattern for points-from-focus type processes".

Company Profile

0.4.10

Campbell; Shannon Roy - Woodinville WA
Campbell, Shannon Roy - Westminster CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Workpiece inspection and defect detection system including monitoring of workpiece images Grant 11,430,105 - Watson , et al. August 30, 2	2022-08-30
Metrology System With Projected Pattern For Points-from-focus Type Processes App 20220138976 - Campbell; Shannon Roy ; et al.	2022-05-05
Workpiece Inspection And Defect Detection System Including Monitoring Of Workpiece Images App 20210390681 - Watson; William Todd ; et al.	2021-12-16
Workpiece inspection and defect detection system indicating number of defect images for training Grant 11,150,200 - Watson , et al. October 19, 2	2021-10-19
Points from focus operations using multiple light settings in a machine vision system Grant 9,060,117 - Bryll , et al. June 16, 2	2015-06-16
Enhanced Edge Focus Tool App 20130162806 - Ding; Yuhua ; et al.	2013-06-27
Points From Focus Operations Using Multiple Light Settings In A Machine Vision System App 20130162807 - Bryll; Robert Kamil ; et al.	2013-06-27
Multi-region Focus Navigation Interface App 20130027538 - Ding; Yuhua ; et al.	2013-01-31
Edge location measurement correction for coaxial light images Grant 8,280,172 - Campbell , et al. October 2, 2	2012-10-02
Edge Location Measurement Correction For Coaxial Light Images App 20120243790 - Campbell; Shannon Roy ; et al.	2012-09-27
Method for matching strings App 20030125931 - Campbell, Shannon Roy	2003-07-03
Method for matching spatial patterns App 20020154819 - Campbell, Shannon Roy	2002-10-24

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