CALLAN; Neal Patrick
Patent Applications and Registrations
Patent applications and USPTO patent grants for CALLAN; Neal Patrick.The latest application filed is for "computational wafer inspection".
- CALLAN; Neal Patrick - Lake Oswego OR
| Patent | Date |
|---|---|
| Computational Wafer Inspection App 20210357570 - FOUQUET; Christophe David ; et al. | 2021-11-18 |
| Computational wafer inspection Grant 11,080,459 - Fouquet , et al. August 3, 2 | 2021-08-03 |
| Computational Wafer Inspection App 20200218849 - Fouquet; Christophe David ; et al. | 2020-07-09 |
| Computational wafer inspection Grant 10,579,772 - Fouquet , et al. | 2020-03-03 |
| Computational Wafer Inspection App 20180365369 - FOUQUET; Christophe David ; et al. | 2018-12-20 |
| Computational wafer inspection Grant 9,990,462 - Fouquet , et al. June 5, 2 | 2018-06-05 |
| Computational Wafer Inspection App 20170046473 - FOUQUET; Christophe David ; et al. | 2017-02-16 |
| Computational wafer inspection Grant 9,507,907 - Fouquet , et al. November 29, 2 | 2016-11-29 |
| Computational Wafer Inspection App 20150356233 - FOUQUET; Christophe David ; et al. | 2015-12-10 |
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