Caldwell; John L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Caldwell; John L..The latest application filed is for "devices and methods for contactless dielectrophoresis for cell or particle manipulation".

Company Profile

0.9.14

Caldwell; John L. - Tucson AZ
Caldwell; John L. - Blacksburg VA US
Caldwell; John L. - Meridian ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Devices And Methods For Contactless Dielectrophoresis For Cell Or Particle Manipulation App 20190137446 - Davalos; Rafael V. ; et al.	2019-05-09
Devices and methods for contactless dielectrophoresis for cell or particle manipulation Grant 10,078,066 - Davalos , et al. September 18, 2	2018-09-18
Devices And Methods For Contactless Dielectrophoresis For Cell Or Particle Manipulation App 20150247820 - Davalos; Rafael V. ; et al.	2015-09-03
Devices and methods for contactless dielectrophoresis for cell or particle manipulation Grant 8,968,542 - Davalos , et al. March 3, 2	2015-03-03
Dielectrophoresis Devices And Methods Therefor App 20120085649 - Sano; Michael B. ; et al.	2012-04-12
Devices And Methods For Contactless Dielectrophoresis For Cell Or Particle Manipulation App 20100224493 - DAVALOS; Rafael V. ; et al.	2010-09-09
Method and apparatus for imager quality testing Grant 7,358,517 - Caldwell April 15, 2	2008-04-15
Test sockets, test systems, and methods for testing microfeature devices Grant 7,256,595 - Caldwell , et al. August 14, 2	2007-08-14
Method of fabricating an electronic device Grant 7,213,330 - Caldwell , et al. May 8, 2	2007-05-08
Method and apparatus for imager quality testing App 20070057210 - Caldwell; John L.	2007-03-15
Stress and force management techniques for a semiconductor die App 20070018336 - Farnworth; Warren M. ; et al.	2007-01-25
Method and apparatus for imager die package quality testing Grant 7,122,819 - Caldwell October 17, 2	2006-10-17
Test sockets, test systems, and methods for testing microfeature devices App 20060197545 - Caldwell; John L. ; et al.	2006-09-07
Test sockets, test systems, and methods for testing microfeature devices App 20060197544 - Caldwell; John L. ; et al.	2006-09-07
Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating same Grant 6,974,330 - Caldwell , et al. December 13, 2	2005-12-13
Method and apparatus for imager die package quality testing App 20050247896 - Caldwell, John L.	2005-11-10
Stress and force management techniques for a semiconductor die App 20050206012 - Farnworth, Warren M. ; et al.	2005-09-22
Test sockets, test systems, and methods for testing microfeature devices App 20050206401 - Caldwell, John L. ; et al.	2005-09-22
Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating same App 20050011660 - Caldwell, John L. ; et al.	2005-01-20
Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating same App 20040026107 - Caldwell, John L. ; et al.	2004-02-12

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