Cai; Zhongping

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cai; Zhongping.The latest application filed is for "systems and methods for calibrating a lidar device".

Company Profile

0.7.7

Cai; Zhongping - San Jose CA
Cai; Zhongping - Fremont CA
Cai; Zhongping - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and Methods for Calibrating a LIDAR Device App 20210325520 - Cai; Zhongping ; et al.	2021-10-21
Method and system for simultaneous tilt and height control of a substrate surface in an inspection system Grant 9,810,619 - Cai , et al. November 7, 2	2017-11-07
Method and system for high speed height control of a substrate surface within a wafer inspection system Grant 9,097,645 - Cai , et al. August 4, 2	2015-08-04
Extended defect sizing range for wafer inspection Grant 9,091,666 - Cai , et al. July 28, 2	2015-07-28
Method and apparatus for producing and measuring dynamically focussed, steered, and shaped oblique laser illumination for spinning wafer inspection system Grant 9,068,952 - Petrenko , et al. June 30, 2	2015-06-30
Method and System for High Speed Height Control of a Substrate Surface Within a Wafer Inspection System App 20150055141 - Cai; Zhongping ; et al.	2015-02-26
Method and System for Tilt and Height Control of a Substrate Surface in an Inspection System App 20140071457 - Cai; Zhongping ; et al.	2014-03-13
Extended Defect Sizing Range for Wafer Inspection App 20130208269 - Cai; Zhongping ; et al.	2013-08-15
Method and apparatus for producing and Measuring dynamically focussed, steered, and shaped oblique laser illumination for spinning wafer inspection system App 20110051132 - Petrenko; Aleksey ; et al.	2011-03-03
Inspection systems and methods for extending the detection range of an inspection system by forcing the photodetector into the non-linear range Grant 7,746,462 - Cai , et al. June 29, 2	2010-06-29
Inspection Systems and Methods for Extending the Detection Range of an Inspection System by Forcing the Photodetector into the Non-Linear Range App 20080291454 - Cai; Zhongping ; et al.	2008-11-27

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