Cai; Lynn

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cai; Lynn.The latest application filed is for "system and method of providing mask defect printability analysis".

Company Profile

0.7.7

Cai; Lynn - Union City CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method of providing mask defect printability analysis Grant 7,835,565 - Cai , et al. November 16, 2	2010-11-16
System And Method Of Providing Mask Defect Printability Analysis App 20090245621 - Cai; Lynn ; et al.	2009-10-01
System and method of providing mask defect printability analysis Grant 7,565,001 - Cai , et al. July 21, 2	2009-07-21
System And Method Of Providing Mask Defect Printability Analysis App 20080260235 - Cai; Lynn ; et al.	2008-10-23
System and method of providing mask defect printability analysis Grant 7,403,649 - Cai , et al. July 22, 2	2008-07-22
System And Method Of Providing Mask Defect Printablity Analysis App 20070292017 - Cai; Lynn ; et al.	2007-12-20
System and method of providing mask defect printability analysis Grant 7,254,251 - Cai , et al. August 7, 2	2007-08-07
System and method of providing mask defect printability analysis App 20050190957 - Cai, Lynn ; et al.	2005-09-01
System and method of providing mask quality control Grant 6,925,202 - Karklin , et al. August 2, 2	2005-08-02
System and method of providing mask defect printability analysis Grant 6,873,720 - Cai , et al. March 29, 2	2005-03-29
Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis Grant 6,870,951 - Cai March 22, 2	2005-03-22
Method and apparatus to facilitate auto-alignment of images for defect inspection and defect analysis App 20030152260 - Cai, Lynn	2003-08-14
System and method of providing mask quality control App 20020164064 - Karklin, Linard ; et al.	2002-11-07
System and method of providing mask defect printability analysis App 20020164065 - Cai, Lynn ; et al.	2002-11-07

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