| Patent | Date |
|---|
Semiconductor devices
Grant 11,429,477 - Byun August 30, 2 | 2022-08-30 |
Semiconductor Devices
App 20210055987 - BYUN; Hee Jin | 2021-02-25 |
Memory Device
App 20200335154 - BYUN; Hee-Jin ; et al. | 2020-10-22 |
Semiconductor device and repair operation method thereof
Grant 10,763,181 - Byun , et al. Sep | 2020-09-01 |
Semiconductor device
Grant 10,706,933 - Byun | 2020-07-07 |
Semiconductor Device
App 20190333583 - BYUN; Hee Jin | 2019-10-31 |
Semiconductor Device And Repair Operation Method Thereof
App 20190164856 - BYUN; Hee-Jin ; et al. | 2019-05-30 |
Semiconductor memory device and method for operating the same
Grant 9,875,777 - Yun , et al. January 23, 2 | 2018-01-23 |
Semiconductor apparatus configured to control data output timing
Grant 9,704,547 - Shim , et al. July 11, 2 | 2017-07-11 |
Semiconductor integrated circuit including semiconductor memory apparatus including a plurality of banks
Grant 9,530,474 - Byun December 27, 2 | 2016-12-27 |
Semiconductor device
Grant 9,472,266 - Seo , et al. October 18, 2 | 2016-10-18 |
Semiconductor Apparatus Configured To Manage An Operation Timing Margin
App 20160240234 - SHIM; Seok Bo ; et al. | 2016-08-18 |
Semiconductor apparatus configured to manage an operation timing margin
Grant 9,349,424 - Shim , et al. May 24, 2 | 2016-05-24 |
Strobe signal generation device and memory apparatus using the same
Grant 9,324,394 - Byun , et al. April 26, 2 | 2016-04-26 |
Semiconductor Device
App 20160005453 - SEO; Jin Cheol ; et al. | 2016-01-07 |
Semiconductor Memory Device And Method For Operating The Same
App 20150380068 - YUN; Dae-Ho ; et al. | 2015-12-31 |
Semiconductor Apparatus Configured To Manage An Operation Timing Margin
App 20150364172 - SHIM; Seok Bo ; et al. | 2015-12-17 |
Semiconductor Memory Apparatus And Semiconductor Integrated Circuit Including The Same
App 20150348604 - BYUN; Hee Jin | 2015-12-03 |
Semiconductor memory apparatus including a plurality of banks and semiconductor integrated circuit including the same
Grant 9,123,403 - Byun September 1, 2 | 2015-09-01 |
Strobe Signal Generation Device And Memory Apparatus Using The Same
App 20150063044 - BYUN; Hee Jin ; et al. | 2015-03-05 |
Semiconductor memory, memory system, and operation method thereof
Grant 8,947,955 - Byun , et al. February 3, 2 | 2015-02-03 |
Semiconductor Memory, Memory System, And Operation Method Thereof
App 20140185396 - BYUN; Hee-Jin ; et al. | 2014-07-03 |
Semiconductor memory device and method for performing data compression test of the same
Grant 8,547,764 - Yun , et al. October 1, 2 | 2013-10-01 |
Semiconductor Memory Apparatus And Semiconductor Integrated Circuit Including The Same
App 20130250712 - BYUN; Hee Jin | 2013-09-26 |
Data strobe signal generating device and a semiconductor memory apparatus using the same
Grant 8,509,005 - Byun August 13, 2 | 2013-08-13 |
Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clock and method thereof
Grant 8,406,080 - Byun March 26, 2 | 2013-03-26 |
Output enable signal generation circuit of semiconductor memory
Grant 8,400,851 - Byun March 19, 2 | 2013-03-19 |
Semiconductor memory device
Grant 8,164,963 - Byun April 24, 2 | 2012-04-24 |
Data Strobe Signal Generating Device And A Semiconductor Memory Apparatus Using The Same
App 20120020172 - BYUN; Hee Jin | 2012-01-26 |
Output Enable Signal Generation Circuit Of Semiconductor Memory
App 20120002493 - BYUN; Hee Jin | 2012-01-05 |
Semiconductor Device And Method For Operating The Same
App 20110292740 - Byun; Hee-Jin ; et al. | 2011-12-01 |
Data strobe signal generating device and a semiconductor memory apparatus using the same
Grant 8,031,553 - Byun October 4, 2 | 2011-10-04 |
Semiconductor Memory Device
App 20110128802 - BYUN; Hee-Jin | 2011-06-02 |
Semiconductor Memory Device And Method For Performing Data Compression Test Of The Same
App 20110103164 - YUN; Jae-Woong ; et al. | 2011-05-05 |
Data Output Control Circuit Of A Double Data Rate (ddr) Synchronous Semiconductor Memory Device Responsive To A Delay Locked Loop (dll) Clock
App 20110051531 - BYUN; Hee-Jin | 2011-03-03 |
Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clock
Grant 7,852,707 - Byun December 14, 2 | 2010-12-14 |
Semiconductor memory device and operation method thereof
Grant 7,843,744 - Byun November 30, 2 | 2010-11-30 |
Circuit for generating output enable signal in semiconductor memory apparatus
Grant 7,738,315 - Byun June 15, 2 | 2010-06-15 |
Data Strobe Signal Generating Device And A Semiconductor Memory Apparatus Using The Same
App 20100091591 - Byun; Hee Jin | 2010-04-15 |
Apparatus for controlling activation period of word line of volatile memory device and method thereof
Grant 7,660,179 - Byun February 9, 2 | 2010-02-09 |
Semiconductor Memory Device And Operation Method Thereof
App 20090273993 - BYUN; Hee-Jin | 2009-11-05 |
Semiconductor Memory Device And Method Of Operating The Same
App 20090116314 - BYUN; Hee-Jin | 2009-05-07 |
Circuit For Generating Output Enable Signal In Semiconductor Memory Apparatus
App 20080222442 - Byun; Hee Jin | 2008-09-11 |
Apparatus For Controlling Activation Period Of Word Line Of Volatile Memory Device And Method Thereof
App 20070280019 - BYUN; Hee Jin | 2007-12-06 |
Bit line sense amplifier control circuit
Grant 7,298,660 - Byun November 20, 2 | 2007-11-20 |
Apparatus for controlling activation period of word line of volatile memory device and method thereof
Grant 7,283,415 - Byun October 16, 2 | 2007-10-16 |
Bit line sense amplifier control circuit
App 20070070751 - Byun; Hee Jin | 2007-03-29 |
Bit line sense amplifier control circuit
Grant 7,158,430 - Byun January 2, 2 | 2007-01-02 |
Apparatus for controlling activation period of word line of volatile memory device and method thereof
App 20060171216 - Byun; Hee Jin | 2006-08-03 |
Bit line sense amplifier control circuit
App 20060044904 - Byun; Hee Jin | 2006-03-02 |
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