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Patent applications and USPTO patent grants for Bystrom; Lars Mats Jan.The latest application filed is for "method and device system for testing electrical components".
Patent | Date |
---|---|
Method and device system for testing electrical components Grant 7,141,960 - Bystrom November 28, 2 | 2006-11-28 |
Method and device system for testing electrical components App 20050142957 - Bystrom, Lars Mats Jan | 2005-06-30 |
Method And Device System For Testing Electrical Components App 20040251921 - Bystrom, Lars Mats Jan ;   et al. | 2004-12-16 |
Voltage detection stick Grant 6,424,139 - Bystrom , et al. July 23, 2 | 2002-07-23 |
Voltage detection stick App 20010011888 - Bystrom, Lars Mats Jan ;   et al. | 2001-08-09 |
Voltage detection stick Grant D445,350 - Bystrom , et al. July 24, 2 | 2001-07-24 |
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