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Patent applications and USPTO patent grants for Buzaglo; Isaac Daniel.The latest application filed is for "method and system for classifying defects in wafer using wafer-defect images, based on deep learning".
Patent | Date |
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Method And System For Classifying Defects In Wafer Using Wafer-defect Images, Based On Deep Learning App 20210334946 - Buzaglo; Isaac Daniel | 2021-10-28 |
Automated histological diagnosis of bacterial infection using image analysis Grant 9,684,960 - Buzaglo , et al. June 20, 2 | 2017-06-20 |
Automated Histological Diagnosis Of Bacterial Infection Using Image Analysis App 20170140528 - HANDZEL; Amir Aharon ;   et al. | 2017-05-18 |
Automated Histological Diagnosis Of Bacterial Infection Using Image Analysis App 20150213599 - Buzaglo; Isaac Daniel ;   et al. | 2015-07-30 |
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