Butler; Kenneth M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Butler; Kenneth M..The latest application filed is for "creating unique device identification for semiconductor devices".

Company Profile

0.8.10

Butler; Kenneth M. - Richardson TX
Butler; Kenneth M - Richardson TX
Butler; Kenneth M. - Plano TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Creating Unique Device Identification For Semiconductor Devices App 20160351508 - Kalyanaraman; Venkataramanan ; et al.	2016-12-01
Through carrier dual side loop-back testing of TSV die after die attach to substrate Grant 8,344,749 - Stillman , et al. January 1, 2	2013-01-01
Semiconductor outlier identification using serially-combined data transform processing methodologies Grant 8,126,681 - Nahar , et al. February 28, 2	2012-02-28
Through Carrier Dual Side Loop-back Testing Of Tsv Die After Die Attach To Substrate App 20110298488 - Stillman; Daniel Joseph ; et al.	2011-12-08
Test method and system for characterizing and/or refining an IC design cycle Grant 8,051,398 - Bittlestone , et al. November 1, 2	2011-11-01
Semiconductor Outlier Identification Using Serially-combined Data Transform Processing Methodologies App 20110071782 - NAHAR; AMIT V. ; et al.	2011-03-24
System and method for estimating test escapes in integrated circuits Grant 7,865,849 - Butler , et al. January 4, 2	2011-01-04
System And Method For Estimating Test Escapes In Integrated Circuits App 20090210830 - Butler; Kenneth M. ; et al.	2009-08-20
Test Method and System for Characterizing and/or Refining an IC Design Cycle App 20090037854 - Bittlestone; Clive D. ; et al.	2009-02-05
Generating scan test vectors for proprietary cores using pseudo pins App 20070288797 - Chakravarthy; Srinivasa ; et al.	2007-12-13
Generating an abbreviated netlist including pseudopin inputs and output nodes Grant 7,203,880 - Chakravarthy , et al. April 10, 2	2007-04-10
Method for test data-driven statistical detection of outlier semiconductor devices Grant 7,129,735 - Subramaniam , et al. October 31, 2	2006-10-31
Power reduction in module-based scan testing App 20060107144 - Saxena; Jayashree ; et al.	2006-05-18
Method for test data-driven statistical detection of outlier semiconductor devices App 20060028229 - Subramaniam; Suresh ; et al.	2006-02-09
Using pseudo-pins in generating scan test vectors for testing an embedded core while maintaining the IP contained therein App 20040158789 - Chakravarthy, Srinivasa ; et al.	2004-08-12
Generating netlist test vectors by stripping references to a pseudo input Grant 6,697,982 - Chakravarthy , et al. February 24, 2	2004-02-24
Using pseudo-pins in generating scan test vectors for testing an embedded core while maintaining the IP contained therein App 20030014703 - Chakravarthy, Srinivasa ; et al.	2003-01-16
System and method for structurally testing integrated circuit devices Grant 5,694,402 - Butler , et al. December 2, 1	1997-12-02

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