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name:-0.0019659996032715
name:-0.021173000335693
name:-0.0014150142669678
Burns; Stuart M. Patent Filings

Burns; Stuart M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Burns; Stuart M..The latest application filed is for "anisotropic nitride etch process with high selectivity to oxide and photoresist layers in a damascene etch scheme".

Company Profile
0.7.0
  • Burns; Stuart M. - Brookfield CT
  • Burns; Stuart M. - Ridgefield CT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Anisotropic nitride etch process with high selectivity to oxide and photoresist layers in a damascene etch scheme
Grant 6,461,529 - Boyd , et al. October 8, 2
2002-10-08
Reactive ion etch loading measurement technique
Grant 6,268,226 - Angell , et al. July 31, 2
2001-07-31
Field effect transistors with improved implants and method for making such transistors
Grant 6,143,635 - Boyd , et al. November 7, 2
2000-11-07
Method for making field effect transistors having sub-lithographic gates with vertical side walls
Grant 6,040,214 - Boyd , et al. March 21, 2
2000-03-21
Low pressure and low power C1.sub.2 /HC1 process for sub-micron metal etching
Grant 5,976,986 - Naeem , et al. November 2, 1
1999-11-02
Silicon sidewall etching
Grant 5,895,273 - Burns , et al. April 20, 1
1999-04-20
Methods for metal etching with reduced sidewall build up during integrated circuit manufacturing
Grant 5,846,884 - Naeem , et al. December 8, 1
1998-12-08

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