Burke; Elliot
Patent Applications and Registrations
Patent applications and USPTO patent grants for Burke; Elliot.The latest application filed is for "multi-wavelength vcsel array to reduce speckle".
- Burke; Elliot - Goleta CA
- Burke; Elliot - Santa Barbara CA
- Burke, Elliot - Golita CA
| Patent | Date |
|---|---|
| Multi-wavelength VCSEL array to reduce speckle Grant 9,065,254 - Geske , et al. June 23, 2 | 2015-06-23 |
| Multi-wavelength Vcsel Array To Reduce Speckle App 20140269796 - Geske; Jonathan ; et al. | 2014-09-18 |
| Multi-wavelength VCSEL array to reduce speckle Grant 8,743,923 - Geske , et al. June 3, 2 | 2014-06-03 |
| Compact near eye display with scanned image generation Grant 8,698,705 - Burke April 15, 2 | 2014-04-15 |
| Multi-wavelength Vcsel Array To Reduce Speckle App 20130194787 - GESKE; JONATHAN ; et al. | 2013-08-01 |
| Beam segmentor for enlarging viewing aperture of microdisplay Grant 8,059,342 - Burke November 15, 2 | 2011-11-15 |
| Compact Near Eye Display With Scanned Image Generation App 20110134017 - Burke; Elliot | 2011-06-09 |
| Beam Segmentor For Enlarging Viewing Aperture Of Microdisplay App 20100254018 - Burke; Elliot | 2010-10-07 |
| Controllable Light Array For Projection Image Display App 20100141905 - Burke; Elliot | 2010-06-10 |
| Apparatus for imaging metrology Grant 7,177,019 - Stanke , et al. February 13, 2 | 2007-02-13 |
| Apparatus for imaging metrology Grant 7,042,580 - Stanke , et al. May 9, 2 | 2006-05-09 |
| Wafer metrology apparatus and method Grant 6,919,958 - Stanke , et al. July 19, 2 | 2005-07-19 |
| Apparatus for imaging metrology App 20050128490 - Stanke, Fred E. ; et al. | 2005-06-16 |
| Wafer metrology apparatus and method App 20030184742 - Stanke, Fred E. ; et al. | 2003-10-02 |
| Wafer metrology apparatus and method Grant 6,563,586 - Stanke , et al. May 13, 2 | 2003-05-13 |
| Modular fiber optic switch core App 20020176651 - Scott, Jeffrey ; et al. | 2002-11-28 |
| Beam convergence system for optical switching cores App 20020176657 - Burke, Elliot ; et al. | 2002-11-28 |
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