Burdine; Todd Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Burdine; Todd Michael.The latest application filed is for "apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics".

Company Profile

0.4.4

Burdine; Todd Michael - Wappingers Falls NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
implementing deterministic based broken scan chain diagnostics Grant 7,475,308 - Anderson , et al. January 6, 2	2009-01-06
Apparatus, And Computer Program Product For Implementing Deterministic Based Broken Scan Chain Diagnostics App 20080189583 - Anderson; Adrian C. ; et al.	2008-08-07
Method for implementing deterministic based broken scan chain diagnostics Grant 7,395,469 - Anderson , et al. July 1, 2	2008-07-01
ABIST-assisted detection of scan chain defects Grant 7,225,374 - Burdine , et al. May 29, 2	2007-05-29
Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD) Grant 7,107,502 - Burdine September 12, 2	2006-09-12
Method, apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics App 20050229057 - Anderson, Adrian C. ; et al.	2005-10-13
Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD) App 20050172188 - Burdine, Todd Michael	2005-08-04
ABIST-assisted detection of scan chain defects App 20050138514 - Burdine, Todd Michael ; et al.	2005-06-23

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