loadpatents
Patent applications and USPTO patent grants for Burch; Richard.The latest application filed is for "sequenced approach for determining wafer path quality".
Patent | Date |
---|---|
Predicting die susceptible to early lifetime failure Grant 11,328,108 - Burch , et al. May 10, 2 | 2022-05-10 |
Sequenced Approach For Determining Wafer Path Quality App 20220066410 - Honda; Tomonori ;   et al. | 2022-03-03 |
Pattern-Enhanced Spatial Correlation of Test Structures to Die Level Responses App 20220043436 - Burch; Richard ;   et al. | 2022-02-10 |
Predicting Equipment Fail Mode from Process Trace App 20220027230 - Burch; Richard ;   et al. | 2022-01-27 |
Automatic Window Generation for Process Trace App 20220027248 - Burch; Richard ;   et al. | 2022-01-27 |
Wafer Bin Map Based Root Cause Analysis App 20210342993 - Honda; Tomonori ;   et al. | 2021-11-04 |
Abnormal Wafer Image Classification App 20210334608 - Honda; Tomonori ;   et al. | 2021-10-28 |
Predicting Die Susceptible to Early Lifetime Failure App 20210279388 - Burch; Richard ;   et al. | 2021-09-09 |
Collaborative Learning Model for Semiconductor Applications App 20210142122 - Honda; Tomonori ;   et al. | 2021-05-13 |
Machine Learning Variable Selection And Root Cause Discovery By Cumulative Prediction App 20210117861 - Burch; Richard ;   et al. | 2021-04-22 |
Die Level Product Modeling Without Die Level Input Data App 20210118754 - Burch; Richard ;   et al. | 2021-04-22 |
Anomalous Equipment Trace Detection and Classification App 20210103489 - Burch; Richard ;   et al. | 2021-04-08 |
Failure detection for wire bonding in semiconductors Grant 10,656,204 - Stine , et al. | 2020-05-19 |
Failure Detection For Wire Bonding In Semiconductors App 20190146032 - Stine; Brian ;   et al. | 2019-05-16 |
Advanced manufacturing insight system for semiconductor application Grant 10,268,562 - Stine , et al. | 2019-04-23 |
Method and system for failure signal detection analysis Grant 7,415,386 - Burch , et al. August 19, 2 | 2008-08-19 |
Method and System for Failure Signal Detention Analysis App 20070288185 - Burch; Richard ;   et al. | 2007-12-13 |
Extraction method of defect density and size distributions Grant 7,024,642 - Hess , et al. April 4, 2 | 2006-04-04 |
Extraction method of defect density and size distributions App 20040094762 - Hess, Christopher ;   et al. | 2004-05-20 |
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