Bultman; Gary

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bultman; Gary.The latest application filed is for "equipment front end module for transferring wafers and method of transferring wafers".

Company Profile

0.27.26

Bultman; Gary - Los Altos CA
Bultman; Gary - Menlo Park CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Equipment front end module for transferring wafers and method of transferring wafers Grant 9,818,633 - Lill , et al. November 14, 2	2017-11-14
Equipment Front End Module For Transferring Wafers And Method Of Transferring Wafers App 20160111309 - Lill; Thorsten ; et al.	2016-04-21
Methods and Systems for Determining a Critical Dimension and Overlay of a Specimen App 20130314710 - Levy; Ady ; et al.	2013-11-28
Methods and systems for determining a critical dimension and overlay of a specimen Grant 8,502,979 - Levy , et al. August 6, 2	2013-08-06
Methods And Systems For Determining A Critical Dimension And Overlay Of A Specimen App 20130039460 - Levy; Ady ; et al.	2013-02-14
Methods and systems for determining a critical dimension and overlay of a specimen Grant 8,179,530 - Levy , et al. May 15, 2	2012-05-15
Methods And Systems For Determining A Critical Dimension And Overlay Of A Specimen App 20100271621 - Levy; Ady ; et al.	2010-10-28
Methods and systems for determining a critical dimension and overlay of a specimen Grant 7,751,046 - Levy , et al. July 6, 2	2010-07-06
Methods and systems for determining a presence of macro and micro defects on a specimen Grant 7,460,981 - Bultman , et al. December 2, 2	2008-12-02
Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography Grant 7,349,090 - Wack , et al. March 25, 2	2008-03-25
Methods and systems for determining a thin film characteristic and an electrical property of a specimen Grant 7,196,782 - Fielden , et al. March 27, 2	2007-03-27
Methods and systems for determining a composition and a thickness of a specimen Grant 7,139,083 - Fielden , et al. November 21, 2	2006-11-21
Methods and systems for determining an adhesion characteristic and a thickness of a specimen Grant 7,130,029 - Wack , et al. October 31, 2	2006-10-31
Methods and systems for determining a presence of defects and a thin film characteristic of a specimen Grant 7,106,425 - Bultman , et al. September 12, 2	2006-09-12
Methods and systems for determining a presence of macro and micro defects on a specimen App 20060072807 - Bultman; Gary ; et al.	2006-04-06
Methods and systems for determining overlay and flatness of a specimen Grant 7,006,235 - Levy , et al. February 28, 2	2006-02-28
Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen Grant 6,950,196 - Fielden , et al. September 27, 2	2005-09-27
Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process Grant 6,946,394 - Fielden , et al. September 20, 2	2005-09-20
Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen Grant 6,919,957 - Nikoonahad , et al. July 19, 2	2005-07-19
Methods and systems for determining flatness, a presence of defects, and a thin film characteristic of a specimen Grant 6,917,419 - Fielden , et al. July 12, 2	2005-07-12
Methods and systems for determining a property of a specimen prior to, during, or subsequent to an etch process Grant 6,917,433 - Levy , et al. July 12, 2	2005-07-12
Methods and systems for determining an implant characteristic and a presence of defects on a specimen Grant 6,891,610 - Nikoonahad , et al. May 10, 2	2005-05-10
Methods and systems for determining a critical dimension and overlay of a specimen Grant 6,891,627 - Levy , et al. May 10, 2	2005-05-10
Methods and systems for determining a presence of macro and micro defects on a specimen Grant 6,829,559 - Bultman , et al. December 7, 2	2004-12-07
Methods and systems for determining a critical dimension and overlay of a specimen App 20040235205 - Levy, Ady ; et al.	2004-11-25
Methods and systems for determining a presence of macro defects and overlay of a specimen Grant 6,818,459 - Wack , et al. November 16, 2	2004-11-16
Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation Grant 6,812,045 - Nikoonahad , et al. November 2, 2	2004-11-02
Methods and systems for determining at least one characteristic of defects on at least two sides of a specimen Grant 6,806,951 - Wack , et al. October 19, 2	2004-10-19
Methods and systems for determining a critical dimension an a presence of defects on a specimen Grant 6,782,337 - Wack , et al. August 24, 2	2004-08-24
Methods and systems for determining a presence of macro defects and overlay of a specimen App 20040115843 - Wack, Dan ; et al.	2004-06-17
Methods and systems for determining a presence of macro and micro defects on a specimen App 20040092045 - Bultman, Gary ; et al.	2004-05-13
Methods and systems for determining a critical dimension and a thin film characteristic of a specimen App 20040073398 - Nikoonahad, Mehrdad ; et al.	2004-04-15
Methods and systems for determining at least four properties of a specimen Grant 6,694,284 - Nikoonahad , et al. February 17, 2	2004-02-17
Methods and systems for determining a presence of macro defects and overlay of a specimen Grant 6,673,637 - Wack , et al. January 6, 2	2004-01-06
Methods and systems for determining a critical dimension and a thin film characteristic of a specimen Grant 6,633,831 - Nikoonahad , et al. October 14, 2	2003-10-14
Methods and systems for determining overlay and flatness of a specimen App 20030011786 - Levy, Ady ; et al.	2003-01-16
Methods and systems for determining a characteristic of micro defects on a specimen App 20020190207 - Levy, Ady ; et al.	2002-12-19
Methods and systems for determining a property of a specimen prior to, during, or subsequent to an etch process App 20020188417 - Levy, Ady ; et al.	2002-12-12
Methods and systems for determining at least one characteristic of defects on at least two sides of a specimen App 20020180985 - Wack, Dan ; et al.	2002-12-05
Methods and systems for determining a thin film characteristic and an electrical property of a specimen App 20020179864 - Fielden, John ; et al.	2002-12-05
Methods and systems for determining flatness, a presence of defects, and a thin film characteristic of a specimen App 20020179867 - Fielden, John ; et al.	2002-12-05
Methods and systems for determining a presence of macro defects and overlay of a specimen App 20020182760 - Wack, Dan ; et al.	2002-12-05
Methods and systems for determining an adhesion characteristic and a thickness of a specimen App 20020180961 - Wack, Dan ; et al.	2002-12-05
Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen App 20020180986 - Nikoonahad, Mehrdad ; et al.	2002-12-05
Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography App 20020106848 - Wack, Dan ; et al.	2002-08-08
Methods and systems for determining a critical dimension and a presence of defects on a specimen App 20020107650 - Wack, Dan ; et al.	2002-08-08
Methods and systems for determining a critical dimension and a thin film characteristic of a specimen App 20020107660 - Nikoonahad, Mehrdad ; et al.	2002-08-08
Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process App 20020102749 - Fielden, John ; et al.	2002-08-01
Methods and systems for determining a composition and a thickness of a specimen App 20020103564 - Fielden, John ; et al.	2002-08-01
Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen App 20020097406 - Fielden, John ; et al.	2002-07-25
Methods and systems for determining an implant characterstic and a presence of defects on a specimen App 20020093648 - Nikoonahad, Mehrdad ; et al.	2002-07-18

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