loadpatents
name:-0.03522801399231
name:-0.019894123077393
name:-0.00054597854614258
Bula; Orest Patent Filings

Bula; Orest

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bula; Orest.The latest application filed is for "mask defect analysis system".

Company Profile
0.15.8
  • Bula; Orest - Shelburne VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Mask defect analysis system
Grant 7,492,941 - Bruce , et al. February 17, 2
2009-02-17
Mask defect analysis system
Grant 7,492,940 - Bruce , et al. February 17, 2
2009-02-17
Mask Defect Analysis System
App 20070248257 - BRUCE; James A. ;   et al.
2007-10-25
Mask Defect Analysis System
App 20070237384 - BRUCE; James A. ;   et al.
2007-10-11
Mask defect analysis system
Grant 7,257,247 - Bruce , et al. August 14, 2
2007-08-14
Interactive optical proximity correction design method
Grant 6,704,695 - Bula , et al. March 9, 2
2004-03-09
Method to control nested to isolated line printing
Grant 6,667,136 - Bula , et al. December 23, 2
2003-12-23
Assist features for contact hole mask patterns
Grant 6,627,361 - Bula , et al. September 30, 2
2003-09-30
Mask defect analysis system
App 20030161525 - Bruce, James A. ;   et al.
2003-08-28
Method for edge bias correction of topography-induced linewidth variation
Grant 6,539,321 - Bruce , et al. March 25, 2
2003-03-25
Method For Edge Bias Correction Of Topography-induced Linewidth Variation
App 20030018443 - Bruce, James A. ;   et al.
2003-01-23
Method to control nested to isolated line printing
App 20030008220 - Bula, Orest ;   et al.
2003-01-09
Assist features for contact hole mask patterns
App 20030008216 - Bula, Orest ;   et al.
2003-01-09
Structure for lithographic focus control features
App 20020122187 - Bruce, James A. ;   et al.
2002-09-05
Auto correction of error checked simulated printed images
Grant 6,425,112 - Bula , et al. July 23, 2
2002-07-23
Method of etch bias proximity correction
Grant 6,395,438 - Bruce , et al. May 28, 2
2002-05-28
Error checking of simulated printed images with process window effects included
Grant 6,373,975 - Bula , et al. April 16, 2
2002-04-16
Method To Control Nested To Isolated Line Printing
App 20010044053 - BULA, OREST ;   et al.
2001-11-22
Micro adjustable illumination aperture
Grant 6,268,908 - Bula , et al. July 31, 2
2001-07-31
Method of modifying a microchip layout data set to generate a predicted mask printed data set
Grant 6,261,724 - Bula , et al. July 17, 2
2001-07-17
Method of forming sharp corners in a photoresist layer
Grant 6,238,850 - Bula , et al. May 29, 2
2001-05-29
Feedback method to repair phase shift masks
Grant 6,016,357 - Neary , et al. January 18, 2
2000-01-18
Apparatus and method for real time data error capture and compression redundancy analysis
Grant 5,317,573 - Bula , et al. May 31, 1
1994-05-31

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