Buijsse; Bart
Patent Applications and Registrations
Patent applications and USPTO patent grants for Buijsse; Bart.The latest application filed is for "dual beam microscope system for imaging during sample processing".
Company Profile
8.35.36
- Buijsse; Bart - Eindhoven NL
Patent Activity
| Patent | Date |
|---|---|
| Methods and systems for acquiring 3D diffraction data Grant 11,456,149 - Buijsse , et al. September 27, 2 | 2022-09-27 |
| Dual Beam Microscope System For Imaging During Sample Processing App 20210391145 - Deng; Yuchen ; et al. | 2021-12-16 |
| Dual beam microscope system for imaging during sample processing Grant 11,183,364 - Deng , et al. November 23, 2 | 2021-11-23 |
| Methods And Systems For Acquiring 3d Diffraction Data App 20210305010 - Buijsse; Bart ; et al. | 2021-09-30 |
| Laser-based phase plate image contrast manipulation Grant 11,101,101 - Buijsse , et al. August 24, 2 | 2021-08-24 |
| Diffraction pattern detection in a transmission charged particle microscope Grant 11,004,655 - Buijsse , et al. May 11, 2 | 2021-05-11 |
| Method and system for determining molecular structure Grant 10,935,506 - Buijsse , et al. March 2, 2 | 2021-03-02 |
| Method And System For Determining Molecular Structure App 20200400594 - Buijsse; Bart ; et al. | 2020-12-24 |
| Laser-based Phase Plate Image Contrast Manipulation App 20200365366 - Buijsse; Bart ; et al. | 2020-11-19 |
| Diffraction pattern detection in a transmission charged particle microscope Grant 10,651,008 - Buijsse , et al. | 2020-05-12 |
| Diffraction Pattern Detection In A Transmission Charged Particle Microscope App 20200144022 - BUIJSSE; Bart ; et al. | 2020-05-07 |
| X-ray imaging technique Grant 10,545,100 - Buijsse , et al. Ja | 2020-01-28 |
| Diffraction Pattern Detection In A Transmission Charged Particle Microscope App 20190057836 - Buijsse; Bart ; et al. | 2019-02-21 |
| Arrangement for X-Ray tomography Grant 9,958,403 - Stejskal , et al. May 1, 2 | 2018-05-01 |
| Arrangement For X-ray Tomography App 20180100815 - Stejskal; Pavel ; et al. | 2018-04-12 |
| Method of producing a freestanding thin film of nano-crystalline graphite Grant 9,908,778 - Buijsse , et al. March 6, 2 | 2018-03-06 |
| User interface for an electron microscope Grant 9,865,427 - Bierhoff , et al. January 9, 2 | 2018-01-09 |
| Novel X-ray Imaging Technique App 20170138870 - Buijsse; Bart ; et al. | 2017-05-18 |
| Aligning a featureless thin film in a TEM Grant 9,583,303 - Buijsse , et al. February 28, 2 | 2017-02-28 |
| Aligning A Featureless Thin Film In A Tem App 20160104596 - Buijsse; Bart ; et al. | 2016-04-14 |
| Method of examining a sample in a charged-particle microscope Grant 9,312,098 - Lazic , et al. April 12, 2 | 2016-04-12 |
| Method of Producing a Freestanding Thin Film of Nano-Crystalline Carbon App 20160096734 - Buijsse; Bart ; et al. | 2016-04-07 |
| Correlative optical and charged particle microscope Grant 9,293,297 - Buijsse March 22, 2 | 2016-03-22 |
| User Interface For An Electron Microscope App 20150332891 - BIERHOFF; MART PETRUS MARIA ; et al. | 2015-11-19 |
| Method of using a phase plate in a transmission electron microscope Grant 9,129,774 - Buijsse , et al. September 8, 2 | 2015-09-08 |
| Method Of Examining A Sample In A Charged-particle Microscope App 20150243474 - Lazic; Ivan ; et al. | 2015-08-27 |
| Correlative Optical And Charged Particle Microscope App 20150214001 - Buijsse; Bart | 2015-07-30 |
| Method Of Producing A Freestanding Thin Film Of Nano-crystalline Graphite App 20150151972 - Buijsse; Bart ; et al. | 2015-06-04 |
| User interface for an electron microscope Grant 9,025,018 - Bierhoff , et al. May 5, 2 | 2015-05-05 |
| Phase shift method for a TEM Grant 9,006,652 - Buijsse April 14, 2 | 2015-04-14 |
| Method Of Using A Phase Plate In A Transmission Electron Microscope App 20140326876 - Buijsse; Bart ; et al. | 2014-11-06 |
| Phase Shift Method For A Tem App 20140326878 - Buijsse; Bart | 2014-11-06 |
| Imaging a sample in a TEM equipped with a phase plate Grant 8,835,846 - Buijsse , et al. September 16, 2 | 2014-09-16 |
| Method of Observing Samples with a Fluorescent Microscope App 20140203191 - Buijsse; Bart ; et al. | 2014-07-24 |
| Phase plate for a TEM Grant 8,772,716 - Buijsse July 8, 2 | 2014-07-08 |
| Imaging A Sample In A Tem Equipped With A Phase Plate App 20140061463 - Buijsse; Bart ; et al. | 2014-03-06 |
| Environmental cell for a particle-optical apparatus Grant 8,658,974 - Buijsse February 25, 2 | 2014-02-25 |
| Blocking member for use in the diffraction plane of a TEM Grant 8,637,821 - Buijsse , et al. January 28, 2 | 2014-01-28 |
| Method for centering an optical element in a TEM comprising a contrast enhancing element Grant 8,633,456 - Buijsse , et al. January 21, 2 | 2014-01-21 |
| Phase Plate for a TEM App 20130313428 - Buijsse; Bart | 2013-11-28 |
| Compact scanning electron microscope Grant 8,309,921 - Bierhoff , et al. November 13, 2 | 2012-11-13 |
| Method for Centering an Optical Element in a TEM Comprising a Contrast Enhancing Element App 20120199756 - Buijsse; Bart ; et al. | 2012-08-09 |
| Environmental cell for a particle-optical apparatus App 20120091338 - Buijsse; Bart | 2012-04-19 |
| Environmental cell for a particle-optical apparatus Grant 8,093,558 - Buijsse January 10, 2 | 2012-01-10 |
| Blocking Member for Use in the Diffraction Plane of a TEM App 20110315876 - Buijsse; Bart ; et al. | 2011-12-29 |
| Compact Scanning Electron Microscope App 20110133083 - BIERHOFF; MART PETRUS MARIA ; et al. | 2011-06-09 |
| Compact scanning electron microscope Grant 7,906,762 - Bierhoff , et al. March 15, 2 | 2011-03-15 |
| Compact Scanning Electron Microscope App 20100230590 - Bierhoff; Mart Petrus Maria ; et al. | 2010-09-16 |
| User Interface for an Electron Microscope App 20100194874 - Bierhoff; Mart Petrus Maria ; et al. | 2010-08-05 |
| Compact Scanning Electron Microscope App 20100171037 - Bierhoff; Mart Petrus Maria ; et al. | 2010-07-08 |
| Environmental Cell for a Particle-Optical Apparatus App 20090242763 - Buijsse; Bart | 2009-10-01 |
| Apparatus for evacuating a sample Grant 7,456,413 - Buijsse , et al. November 25, 2 | 2008-11-25 |
| Method of localizing fluorescent markers Grant 7,317,515 - Buijsse , et al. January 8, 2 | 2008-01-08 |
| Cluster tool for microscopic processing of samples Grant 7,301,157 - Buijsse , et al. November 27, 2 | 2007-11-27 |
| Apparatus with permanent magnetic lenses Grant 7,285,785 - Buijsse , et al. October 23, 2 | 2007-10-23 |
| Cluster tool for microscopic processing of samples App 20070080291 - Buijsse; Bart ; et al. | 2007-04-12 |
| X-ray microscope having an X-ray source for soft X-ray Grant 7,173,999 - Buijsse February 6, 2 | 2007-02-06 |
| Apparatus for evacuating a sample App 20060284108 - Buijsse; Bart ; et al. | 2006-12-21 |
| Apparatus with permanent magnetic lenses App 20060197030 - Buijsse; Bart ; et al. | 2006-09-07 |
| Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens Grant 7,067,820 - Buijsse June 27, 2 | 2006-06-27 |
| Apparatus with permanent magnetic lenses Grant 7,064,325 - Buijsse , et al. June 20, 2 | 2006-06-20 |
| Method of localizing fluorescent markers App 20060098188 - Buijsse; Bart ; et al. | 2006-05-11 |
| Apparatus with permanent magnetic lenses App 20050236568 - Buijsse, Bart ; et al. | 2005-10-27 |
| Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sample App 20050069082 - Buijsse, Bart ; et al. | 2005-03-31 |
| Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lens App 20040211914 - Buijsse, Bart | 2004-10-28 |
| X-ray microscope having an X-ray source for soft X-ray App 20030219097 - Buijsse, Bart | 2003-11-27 |
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