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name:-0.0097179412841797
name:-0.0067260265350342
name:-0.00050497055053711
Bu; Xiaomei Patent Filings

Bu; Xiaomei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bu; Xiaomei.The latest application filed is for "reliable interconnect for semiconductor device".

Company Profile
0.8.7
  • Bu; Xiaomei - Singapore SG
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Reliable interconnect for semiconductor device
Grant 9,054,107 - Zhang , et al. June 9, 2
2015-06-09
Reliable Interconnect For Semiconductor Device
App 20140084486 - ZHANG; Fan ;   et al.
2014-03-27
Reliable interconnect for semiconductor device
Grant 8,598,031 - Zhang , et al. December 3, 2
2013-12-03
Grain boundary blocking for stress migration and electromigration improvement in CU interconnects
Grant 7,989,338 - Zhang , et al. August 2, 2
2011-08-02
Reliable Interconnect For Semiconductor Device
App 20110074039 - ZHANG; Fan ;   et al.
2011-03-31
Combined copper plating method to improve gap fill
Grant 7,585,768 - Bu , et al. September 8, 2
2009-09-08
Combined copper plating method to improve gap fill
App 20070293039 - Bu; Xiaomei ;   et al.
2007-12-20
Integrated circuit with protective moat
Grant 7,224,060 - Zhang , et al. May 29, 2
2007-05-29
Grain boundary blocking for stress migration and electromigration improvement in CU interconnects
App 20060286797 - Zhang; Fan ;   et al.
2006-12-21
Structure and method of liner air gap formation
Grant 7,094,669 - Bu , et al. August 22, 2
2006-08-22
Structure and method of liner air gap formation
App 20060030128 - Bu; Xiaomei ;   et al.
2006-02-09
Integrated circuit with protective moat
App 20050167824 - Zhang, Fan ;   et al.
2005-08-04
Method to form Cu/OSG dual damascene structure for high performance and reliable interconnects
Grant 6,913,994 - Guo , et al. July 5, 2
2005-07-05
Method to form Cu/OSG dual damascene structure for high performance and reliable interconnects
App 20040203223 - Guo, Qiang ;   et al.
2004-10-14

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