Brunier; Francois
Patent Applications and Registrations
Patent applications and USPTO patent grants for Brunier; Francois.The latest application filed is for "etching composition, in particular for silicon materials, method for characterizing defects on surfaces of such materials and process of treating such surfaces with the etching compostion".
- Brunier; Francois - Bernin FR
- Brunier; Francois - Grenoble FR
| Patent | Date |
|---|---|
| Etching Composition, In Particular For Silicon Materials, Method For Characterizing Defects On Surfaces Of Such Materials And Process Of Treating Such Surfaces With The Etching Compostion App 20120094501 - Maehliss; Jochen ; et al. | 2012-04-19 |
| Treatment of the working layer of a multilayer structure Grant 7,790,048 - Allibert , et al. September 7, 2 | 2010-09-07 |
| Method for reducing the trap density in a semiconductor wafer Grant 7,601,606 - Brunier , et al. October 13, 2 | 2009-10-13 |
| Process for manufacturing a multilayer structure made from semiconducting materials Grant 7,585,748 - Raskin , et al. September 8, 2 | 2009-09-08 |
| Method for reducing the trap density in a semiconductor wafer App 20070020886 - Brunier; Francois ; et al. | 2007-01-25 |
| Treatment of the working layer of a multilayer structure App 20060201907 - Allibert; Frederic ; et al. | 2006-09-14 |
| Process for manufacturing a multilayer structure made from semiconducting materials App 20060166451 - Raskin; Jean-Pierre ; et al. | 2006-07-27 |
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