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name:-0.021413087844849
name:-0.001694917678833
Brunfeld; Andrei Patent Filings

Brunfeld; Andrei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Brunfeld; Andrei.The latest application filed is for "optical inspection system with polarization isolation of detection system reflections".

Company Profile
0.18.20
  • Brunfeld; Andrei - Cupertino CA US
  • Brunfeld; Andrei - Bay-Yam IL
  • Brunfeld; Andrei - Bat-Yam IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Optical inspection system with polarization isolation of detection system reflections
Grant 8,436,997 - Brunfeld , et al. May 7, 2
2013-05-07
Optical Inspection System With Polarization Isolation Of Detection System Reflections
App 20120154806 - Brunfeld; Andrei ;   et al.
2012-06-21
Optical Measuring System With Illumination Provided Through A Void In A Collecting Lens
App 20120057172 - Brunfeld; Andrei ;   et al.
2012-03-08
Optical Measuring System With Matched Collection Lens And Detector Light Guide
App 20120057154 - Brunfeld; Andrei ;   et al.
2012-03-08
Fluorescence-detecting Disk Inspection System
App 20120008135 - Toker; Gregory ;   et al.
2012-01-12
Time dependent fluorescence measurements
Grant 7,812,956 - Cromwell , et al. October 12, 2
2010-10-12
Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts
Grant 7,671,978 - Clark , et al. March 2, 2
2010-03-02
Measuring time dependent fluorescence
Grant 7,576,862 - Cromwell , et al. August 18, 2
2009-08-18
Scatterometer-interferometer And Method For Detecting And Distinguishing Characteristics Of Surface Artifacts
App 20080266547 - Clark; Bryan ;   et al.
2008-10-30
Time dependent fluorescence measurements
App 20080174842 - Cromwell; Evan F. ;   et al.
2008-07-24
Resonant ellipsometer and method for determining ellipsometric parameters of a surface
Grant 7,330,277 - Brunfeld , et al. February 12, 2
2008-02-12
Fabry-perot resonator apparatus and method including an in-resonator polarizing element
Grant 7,294,825 - Toker , et al. November 13, 2
2007-11-13
Method and apparatus for simultaneous 2-D and topographical inspection
Grant 7,253,891 - Toker , et al. August 7, 2
2007-08-07
Three-dimensional imaging resonator and method therefor
Grant 7,220,955 - Brunfeld , et al. May 22, 2
2007-05-22
Resonator method and system for distinguishing characteristics of surface features or contaminants
Grant 7,214,932 - Brunfeld , et al. May 8, 2
2007-05-08
Method and system for optical measurement via a resonator having a non-uniform phase profile
Grant 7,193,725 - Brunfeld , et al. March 20, 2
2007-03-20
Active sensor and method for optical illumination and detection
Grant 7,170,605 - Cromwell , et al. January 30, 2
2007-01-30
Method and system for determining surface feature characteristics using slit detectors
Grant 7,102,740 - Clark , et al. September 5, 2
2006-09-05
Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical system
Grant 7,022,978 - Clark , et al. April 4, 2
2006-04-04
Three-dimensional imaging resonator and method therefor
App 20050279954 - Brunfeld, Andrei ;   et al.
2005-12-22
Resonator method and system for distinguishing characteristics of surface features or contaminants
App 20050236589 - Brunfeld, Andrei ;   et al.
2005-10-27
Fabry-perot resonator apparatus and method including an in-resonator polarizing element
App 20050232330 - Toker, Gregory ;   et al.
2005-10-20
Resonant ellipsometer and method for determining ellipsometric parameters of a surface
App 20050225775 - Brunfeld, Andrei ;   et al.
2005-10-13
Fabry-perot resonator apparatus and method for observing low reflectivity surfaces
App 20050218350 - Brunfeld, Andrei ;   et al.
2005-10-06
Apparatus and method for measuring thickness variation of wax film
App 20050157308 - Brunfeld, Andrei ;   et al.
2005-07-21
Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator
Grant 6,879,421 - Clark , et al. April 12, 2
2005-04-12
Method and system for determining surface feature characteristics using slit detectors
App 20050046829 - Clark, Bryan ;   et al.
2005-03-03
Time dependent fluorescence measurements
App 20050046848 - Cromwell, Evan F. ;   et al.
2005-03-03
Active sensor and method for optical illumination and detection
App 20050046847 - Cromwell, Evan Francis ;   et al.
2005-03-03
Measuring time dependent fluorescence
App 20050046849 - Cromwell, Evan F. ;   et al.
2005-03-03
Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonator
App 20040190148 - Clark, Bryan ;   et al.
2004-09-30
Method and apparatus for simultaneous 2-D and topographical inspection
App 20040156043 - Toker, Gregory ;   et al.
2004-08-12
Method and system for optical measurement via a resonator having a non-uniform phase profile
App 20040156085 - Brunfeld, Andrei ;   et al.
2004-08-12
Method and apparatus for illumination and entertainment by light emitted from a guide via scattering
Grant 6,629,772 - Brunfeld October 7, 2
2003-10-07
Method and apparatus for illumination and entertainment by light emitted from a guide via scattering
App 20030081431 - Brunfeld, Andrei
2003-05-01
High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor
Grant 6,294,793 - Brunfeld , et al. September 25, 2
2001-09-25
Interferometric measurement device with non stabilized light source
Grant 5,189,489 - Brunfeld February 23, 1
1993-02-23

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