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Patent applications and USPTO patent grants for Brun Sensor Systems, Inc..The latest application filed is for "apparatus and method for eliminating interference errors in dual-beam infrared reflection measurements on a diffusely reflecting surface by geometrical elimination of interference-producing specularly-reflected radiation components".
Patent | Date |
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Apparatus And Method For Eliminating Interference Errors In Dual-beam Infrared Reflection Measurements On A Diffusely Reflecting Surface By Geometrical Elimination Of Interference-producing Specularly-reflected Radiation Components Grant 3,693,025 - Brunton September 19, 1 | 1972-09-19 |
Apparatus And Methods For Eliminating Interference Effect Errors In Dual-beam Infrared Measurements Grant 3,631,526 - Brunton December 28, 1 | 1971-12-28 |
Infrared Measurement Technique Grant 3,597,616 - Brunton , et al. August 3, 1 | 1971-08-03 |
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