Brun Sensor Systems, Inc.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Brun Sensor Systems, Inc..The latest application filed is for "apparatus and method for eliminating interference errors in dual-beam infrared reflection measurements on a diffusely reflecting surface by geometrical elimination of interference-producing specularly-reflected radiation components".
- Brun Sensor Systems, Inc. - Columbus OH
| Patent | Date |
|---|---|
| Apparatus And Method For Eliminating Interference Errors In Dual-beam Infrared Reflection Measurements On A Diffusely Reflecting Surface By Geometrical Elimination Of Interference-producing Specularly-reflected Radiation Components Grant 3,693,025 - Brunton September 19, 1 | 1972-09-19 |
| Apparatus And Methods For Eliminating Interference Effect Errors In Dual-beam Infrared Measurements Grant 3,631,526 - Brunton December 28, 1 | 1971-12-28 |
| Infrared Measurement Technique Grant 3,597,616 - Brunton , et al. August 3, 1 | 1971-08-03 |
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