BRUKER JV ISRAEL LTD.
Patent Applications and Registrations
Patent applications and USPTO patent grants for BRUKER JV ISRAEL LTD..The latest application filed is for "x-ray tube".
- BRUKER JV ISRAEL LTD. - Migdal HaEmek N/A IL
- BRUKER JV ISRAEL LTD - Migdal Haemek IL
Trademarks
| Patent | Date |
|---|---|
| Method and apparatus for X-ray scatterometry Grant 11,169,099 - Krokhmal , et al. November 9, 2 | 2021-11-09 |
| Wafer alignment for small-angle x-ray scatterometry Grant 10,976,269 - Vinshtein , et al. April 13, 2 | 2021-04-13 |
| X-ray source optics for small-angle X-ray scatterometry Grant 10,976,268 - Wormington , et al. April 13, 2 | 2021-04-13 |
| X-ray detection optics for small-angle X-ray scatterometry Grant 10,976,270 - Wormington , et al. April 13, 2 | 2021-04-13 |
| Image contrast in X-ray topography imaging for defect inspection Grant 10,816,487 - Matney , et al. October 27, 2 | 2020-10-27 |
| Method and apparatus for X-ray scatterometry Grant 10,684,238 - Krokhmal , et al. | 2020-06-16 |
| X-ray Tube App 20200168427 - Krokhmal; Alexander ; et al. | 2020-05-28 |
| X-ray fluorescence apparatus for contamination monitoring Grant 10,634,628 - Kasper , et al. | 2020-04-28 |
| Method And Apparatus For X-ray Scatterometry App 20190339215 - Krokhmal; Alex ; et al. | 2019-11-07 |
| X-ray detection optics for small-angle X-ray scatterometry App 20190323974 - Wormington; Matthew ; et al. | 2019-10-24 |
| Wafer alignment for small-angle X-ray scatterometry App 20190323976 - Vinshtein; Yuri ; et al. | 2019-10-24 |
| X-ray source optics for small-angle X-ray scatterometry App 20190323975 - Wormington; Matthew ; et al. | 2019-10-24 |
| Image contrast in X-Ray topography imaging for defect inspection App 20190317028 - Matney; Kevin Monroe ; et al. | 2019-10-17 |
| Closed-loop control of X-ray knife edge Grant 10,386,313 - Mazor , et al. A | 2019-08-20 |
| X-Ray Fluorescence Apparatus for Contamination Monitoring App 20180348151 - Kasper; Nikolai ; et al. | 2018-12-06 |
| Closed-loop control of X-ray knife edge App 20180088062 - Mazor; Isaac ; et al. | 2018-03-29 |
| X-ray tube Grant 9,852,875 - Wall December 26, 2 | 2017-12-26 |
| Measurement of small features using XRF Grant 9,829,448 - Wormington , et al. November 28, 2 | 2017-11-28 |
| X-ray tube App 20170323759 - Wall; John Leonard | 2017-11-09 |
| X-ray tube anode Grant 9,748,070 - Wall August 29, 2 | 2017-08-29 |
| Using multiple sources/detectors for high-throughput X-ray topography measurement Grant 9,726,624 - Ryan , et al. August 8, 2 | 2017-08-08 |
| Method And Apparatus For X-ray Scatterometry App 20170199136 - Krokhmal; Alex ; et al. | 2017-07-13 |
| X-ray source assembly Grant 9,666,322 - Mazor , et al. May 30, 2 | 2017-05-30 |
| Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF Grant 9,632,043 - Mazor , et al. April 25, 2 | 2017-04-25 |
| X-ray scatterometry apparatus Grant 9,606,073 - Mazor , et al. March 28, 2 | 2017-03-28 |
| Angle calibration for grazing-incidence X-ray fluorescence (GIXRF) Grant 9,551,677 - Mazor , et al. January 24, 2 | 2017-01-24 |
| X-ray inspection of bumps on a semiconductor substrate Grant 9,390,984 - Mazor , et al. July 12, 2 | 2016-07-12 |
| Estimation of XRF intensity from an array of micro-bumps Grant 9,389,192 - Tokar , et al. July 12, 2 | 2016-07-12 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 