loadpatents
name:-0.020704030990601
name:-0.027935981750488
name:-0.00059604644775391
BRIGHT; Nicolas J. Patent Filings

BRIGHT; Nicolas J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for BRIGHT; Nicolas J..The latest application filed is for "chamber body design architecture for next generation advanced plasma technology".

Company Profile
0.20.17
  • BRIGHT; Nicolas J. - Arlington WA
  • Bright; Nicolas J. - Saratoga CA
  • Bright; Nicolas J. - Malibu CA US
  • Bright; Nicolas J. - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Chamber Body Design Architecture For Next Generation Advanced Plasma Technology
App 20220213959 - HOWARD; Bradley J. ;   et al.
2022-07-07
Chamber body design architecture for next generation advanced plasma technology
Grant 11,333,246 - Nguyen , et al. May 17, 2
2022-05-17
Uniform Wafer Temperature Achievement In Unsymmetric Chamber Environment
App 20170178758 - HA; Sungwon ;   et al.
2017-06-22
Chamber Body Design Architecture For Next Generation Advanced Plasma Technology
App 20160215883 - NGUYEN; ANDREW ;   et al.
2016-07-28
Post etch treatment (PET) of a low-K dielectric film
Grant 8,871,650 - Nemani , et al. October 28, 2
2014-10-28
Post Etch Treatment (pet) Of A Low-k Dielectric Film
App 20130109187 - Nemani; Srinivas D. ;   et al.
2013-05-02
Methods for making dual-damascene dielectric structures
Grant 7,501,339 - Uglow , et al. March 10, 2
2009-03-10
Method and apparatus for real time metal film thickness measurement
Grant 7,309,618 - Gotkis , et al. December 18, 2
2007-12-18
Enhancement of eddy current based measurement capabilities
Grant 7,084,621 - Gotkis , et al. August 1, 2
2006-08-01
Methods for making dual-damascene dielectric structures
App 20060166485 - Uglow; Jay E. ;   et al.
2006-07-27
Methods for making dual-damascene dielectric structures
Grant 7,060,605 - Uglow , et al. June 13, 2
2006-06-13
Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
Grant 7,010,468 - Gotkis , et al. March 7, 2
2006-03-07
Method and apparatus of arrayed sensors for metrological control
Grant 6,951,624 - Gotkis , et al. October 4, 2
2005-10-04
Complementary sensors metrological process and method and apparatus for implementing the same
Grant 6,922,053 - Gotkis , et al. July 26, 2
2005-07-26
Dual-damascene dielectric structures
Grant 6,909,190 - Uglow , et al. June 21, 2
2005-06-21
Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
App 20050125202 - Gotkis, Yehiel ;   et al.
2005-06-09
Method and apparatus for metrological process control implementing complementary sensors
Grant 6,894,491 - Gotkis , et al. May 17, 2
2005-05-17
Method and apparatus for wafer mechanical stress monitoring and wafer thermal stress monitoring
App 20050066739 - Gotkis, Yehiel ;   et al.
2005-03-31
Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
Grant 6,859,765 - Gotkis , et al. February 22, 2
2005-02-22
Complementary sensors metrological process and method and apparatus for implementing the same
App 20050007107 - Gotkis, Yehiel ;   et al.
2005-01-13
Method and apparatus of arrayed sensors for metrological control
App 20050000653 - Gotkis, Yehiel ;   et al.
2005-01-06
Method and apparatus of arrayed sensors for metrological control
Grant 6,808,590 - Gotkis , et al. October 26, 2
2004-10-26
Method And Apparatus For Metrological Process Control Implementing Complimentary Sensors
App 20040119468 - Gotkis, Yehiel ;   et al.
2004-06-24
Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
App 20040117054 - Gotkis, Yehiel ;   et al.
2004-06-17
Enhancement of eddy current based measurement capabilities
App 20040058545 - Gotkis, Yehiel ;   et al.
2004-03-25
Method and apparatus for applying differential removal rates to a surface of a substrate
App 20040011462 - Gotkis, Yehiel ;   et al.
2004-01-22
Method and apparatus for real time metal film thickness measurement
App 20040002171 - Gotkis, Yehiel ;   et al.
2004-01-01
Dual - Damascene Dielectric Structures
App 20010010970 - Uglow, Jay E. ;   et al.
2001-08-02
Methods for making dual-damascene dielectric structures
App 20010009803 - Uglow, Jay E. ;   et al.
2001-07-26
Dual-damascene dielectric structures and methods for making the same
Grant 6,251,770 - Uglow , et al. June 26, 2
2001-06-26
Plasma etch apparatus with heated scavenging surfaces
Grant 5,770,099 - Rice , et al. June 23, 1
1998-06-23
Electrostatic chuck usable in high density plasma
Grant 5,583,737 - Collins , et al. December 10, 1
1996-12-10
Electrostatic chuck usable in high density plasma
Grant 5,539,609 - Collins , et al. July 23, 1
1996-07-23
Plasma etch apparatus with heated scavenging surfaces
Grant 5,477,975 - Rice , et al. December 26, 1
1995-12-26
Electrostatic chuck for high power plasma processing
Grant 5,350,479 - Collins , et al. September 27, 1
1994-09-27
Company Registrations
SEC0001226893BRIGHT NICOLAS J

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed