loadpatents
name:-0.049131870269775
name:-0.016948938369751
name:-0.00052499771118164
Bright; Nicolas Patent Filings

Bright; Nicolas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bright; Nicolas.The latest application filed is for "process integration scheme to lower overall dielectric constant in beol interconnect structures".

Company Profile
0.15.12
  • Bright; Nicolas - San Jose CA
  • Bright; Nicolas - Saratoga CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Process integration scheme to lower overall dielectric constant in BEoL interconnect structures
Grant 9,076,844 - Bright , et al. July 7, 2
2015-07-07
Automatic dynamic baseline creation and adjustment
Grant 7,899,627 - Huang , et al. March 1, 2
2011-03-01
Methods and arrangement for creating recipes using best-known methods
Grant 7,542,820 - Huang , et al. June 2, 2
2009-06-02
Process Integration Scheme To Lower Overall Dielectric Constant In Beol Interconnect Structures
App 20090134520 - Bright; Nicolas ;   et al.
2009-05-28
Computer readable mask shrink control processor
Grant 7,539,969 - Sadjadi , et al. May 26, 2
2009-05-26
Process integration scheme to lower overall dielectric constant in BEoL interconnect structures
Grant 7,521,358 - Bright , et al. April 21, 2
2009-04-21
Reticle alignment and overlay for multiple reticle process
Grant 7,465,525 - Sadjadi , et al. December 16, 2
2008-12-16
Methods and Arrangement for Creating Recipes Using Best-Known Methods
App 20080188970 - Huang; Chung-Ho ;   et al.
2008-08-07
Process integration scheme to lower overall dielectric constant in BEoL interconnect structures
App 20080150138 - Bright; Nicolas ;   et al.
2008-06-26
Automatic Dynamic Baseline Creation And Adjustment
App 20080079918 - Huang; Chung-Ho ;   et al.
2008-04-03
Smart component-based management techniques in a substrate processing system
Grant 7,254,510 - Benjamin , et al. August 7, 2
2007-08-07
Smart component-based management techniques in a substrate processing system
Grant 7,152,011 - Benjamin , et al. December 19, 2
2006-12-19
Smart component-based management techniques in a substrate processing system
App 20060271325 - Benjamin; Neil ;   et al.
2006-11-30
Computer readable mask shrink control processor
App 20060259886 - Sadjadi; S.M. Reza ;   et al.
2006-11-16
Reticle alignment and overlay for multiple reticle process
App 20060257750 - Sadjadi; S.M. Reza ;   et al.
2006-11-16
Apparatus for controlling wafer temperature in chemical mechanical polishing
Grant 7,029,368 - Bright , et al. April 18, 2
2006-04-18
Smart component-based management techniques in a substrate processing system
App 20060047458 - Benjamin; Neil ;   et al.
2006-03-02
Apparatus methods for controlling wafer temperature in chemical mechanical polishing
Grant 6,984,162 - Bright , et al. January 10, 2
2006-01-10
System and method for metal residue detection and mapping within a multi-step sequence
Grant 6,929,531 - Gotkis , et al. August 16, 2
2005-08-16
Apparatus methods for controlling wafer temperature in chemical mechanical polishing
App 20040242124 - Bright, Nicolas ;   et al.
2004-12-02
Apparatus methods for controlling wafer temperature in chemical mechanical polishing
App 20040108065 - Bright, Nicolas ;   et al.
2004-06-10
Apparatus and methods for controlling wafer temperature in chemical mechanical polishing
Grant 6,736,720 - Bright , et al. May 18, 2
2004-05-18
System and method for metal residue detection and mapping within a multi-step sequence
App 20040058620 - Gotkis, Yehiel ;   et al.
2004-03-25
Apparatus and methods for controlling wafer temperature in chemical mechanical polishing
App 20030119429 - Bright, Nicolas ;   et al.
2003-06-26
Method and apparatus for controlling the volume of a plasma
Grant 6,322,661 - Bailey, III , et al. November 27, 2
2001-11-27
Oxide etch process with high selectivity to nitride suitable for use on surfaces of uneven topography
Grant 6,194,325 - Yang , et al. February 27, 2
2001-02-27

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