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Patent applications and USPTO patent grants for Brandner; Markus.The latest application filed is for "characterizing a height profile of a sample by side view imaging".
Patent | Date |
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Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view Grant 10,684,307 - Koller , et al. | 2020-06-16 |
Characterizing a height profile of a sample by side view imaging Grant 10,488,434 - Godec-Schonbacher , et al. Nov | 2019-11-26 |
Characterizing a Height Profile of a Sample by Side View Imaging App 20190049486 - GODEC-SCHONBACHER; Martin ;   et al. | 2019-02-14 |
Imaging a Gap Between Sample and Probe of a Scanning Probe Microscope in a Substantially Horizontal Side View App 20180143221 - Koller; Daniel ;   et al. | 2018-05-24 |
Measurement method, sensor arrangement and measurement system Grant 8,368,393 - Zangl , et al. February 5, 2 | 2013-02-05 |
Measurement Method, Sensor Arrangement and Measurement System App 20110025313 - Zangl; Hubert ;   et al. | 2011-02-03 |
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