Brady; Gregory

Patent Applications and Registrations

Patent applications and USPTO patent grants for Brady; Gregory.The latest application filed is for "optical metrology tool equipped with modulated illumination sources".

Company Profile

3.9.9

Brady; Gregory - San Jose CA
Brady; Gregory - Campbell CA
Brady; Gregory - Charlotte NC

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Metrology Tool Equipped With Modulated Illumination Sources App 20210223166 - Shchegrov; Andrei V. ; et al.	2021-07-22
Reflective pupil relay system Grant 10,976,249 - Hill , et al. April 13, 2	2021-04-13
Optical metrology tool equipped with modulated illumination sources Grant 10,969,328 - Shchegrov , et al. April 6, 2	2021-04-06
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20190195782 - Shchegrov; Andrei V. ; et al.	2019-06-27
Optical metrology tool equipped with modulated illumination sources Grant 10,215,688 - Shchegrov , et al. Feb	2019-02-26
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20170016815 - Shchegrov; Andrei V. ; et al.	2017-01-19
Optical metrology tool equipped with modulated illumination sources Grant 9,400,246 - Shchegrov , et al. July 26, 2	2016-07-26
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,310,290 - Wang , et al. April 12, 2	2016-04-12
Metrology system optimization for parameter tracking Grant 9,255,877 - Veldman , et al. February 9, 2	2016-02-09
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20150285735 - Wang; David Y. ; et al.	2015-10-08
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,116,103 - Wang , et al. August 25, 2	2015-08-25
Apparatus and method of measuring roughness and other parameters of a structure Grant 8,982,358 - Shchegrov , et al. March 17, 2	2015-03-17
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20140375981 - Wang; David Y. ; et al.	2014-12-25
Metrology System Optimization For Parameter Tracking App 20140347666 - Veldman; Andrei ; et al.	2014-11-27
Apparatus And Method Of Measuring Roughness And Other Parameters Of A Structure App 20130182263 - Shchegrov; Andrei V. ; et al.	2013-07-18
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20130169966 - Shchegrov; Andrei V. ; et al.	2013-07-04
Conic constant measurement methods for refractive microlenses Grant 6,788,423 - Kathman , et al. September 7, 2	2004-09-07
Conic constant measurement methods for refractive microlenses App 20030053077 - Kathman, Alan D. ; et al.	2003-03-20

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