| Patent | Date |
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Method And System For Non-destructive Metrology Of Thin Layers
App 20220074878 - Lee; Wei ; et al. | 2022-03-10 |
Method And System For Optical Characterization Of Patterned Samples
App 20210116359 - SHAFIR; Dror ; et al. | 2021-04-22 |
Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry
Grant 10,943,907 - Bozdog , et al. March 9, 2 | 2021-03-09 |
Method and system for optical characterization of patterned samples
Grant 10,876,959 - Shafir , et al. December 29, 2 | 2020-12-29 |
Integrated Circuitry Comprising An Array, Method Of Forming An Array, Method Of Forming DRAM Circuitry, And Method Used In The F
App 20200266197 - Bozdog; Cornel ; et al. | 2020-08-20 |
Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry
Grant 10,707,211 - Bozdog , et al. | 2020-07-07 |
Method And System For Non-destructive Metrology Of Thin Layers
App 20200191734 - Lee; Wei Ti ; et al. | 2020-06-18 |
Integrated Circuitry Comprising An Array, Method Of Forming An Array, Method Of Forming DRAM Circuitry, And Method Used In The F
App 20200098761 - Bozdog; Cornel ; et al. | 2020-03-26 |
Method and system for non-destructive metrology of thin layers
Grant 10,533,961 - Lee , et al. Ja | 2020-01-14 |
Method for use in process control of manufacture of patterned sample
Grant 10,534,275 - Bozdog , et al. Ja | 2020-01-14 |
Scatterometry method and system
Grant 10,302,414 - Wainreb , et al. | 2019-05-28 |
Method and system for determining strain distribution in a sample
Grant 10,209,206 - Barak , et al. Feb | 2019-02-19 |
Optical metrology for in-situ measurements
Grant 10,197,506 - Turovets , et al. Fe | 2019-02-05 |
Method And System For Optical Characterization Of Patterned Samples
App 20180328837 - SHAFIR; Dror ; et al. | 2018-11-15 |
Method And System For Non-destructive Metrology Of Thin Layers
App 20180328871 - Lee; Wei Ti ; et al. | 2018-11-15 |
Measurement system and method for measuring in thin films
Grant 10,030,971 - Bozdog , et al. July 24, 2 | 2018-07-24 |
Optical Metrology For In-situ Measurements
App 20180195975 - TUROVETS; Igor ; et al. | 2018-07-12 |
Method For Use In Process Control Of Manufacture Of Patterned Sample
App 20180196356 - BOZDOG; Cornel ; et al. | 2018-07-12 |
Method And System For Non-destructive Metrology Of Thin Layers
App 20180172609 - LEE; Wei Ti ; et al. | 2018-06-21 |
Optical metrology for in-situ measurements
Grant 9,915,624 - Turovets , et al. March 13, 2 | 2018-03-13 |
Optical Metrology For In-situ Measurements
App 20170167987 - TUROVETS; Igor ; et al. | 2017-06-15 |
Measurement System And Method For Measuring In Thin Films
App 20170038201 - Bozdog; Cornel ; et al. | 2017-02-09 |
Optical metrology for in-situ measurements
Grant 9,528,946 - Turovets , et al. December 27, 2 | 2016-12-27 |
Method And System For Determining Strain Distribution In A Sample
App 20160139065 - BARAK; Gilad ; et al. | 2016-05-19 |
Scatterometry Method And System
App 20160076876 - WAINREB; Gilad ; et al. | 2016-03-17 |
Method And System For Optical Characterization Of Patterned Samples
App 20150316468 - SHAFIR; Dror ; et al. | 2015-11-05 |
Optical Metrology For In-situ Measurements
App 20150226680 - Turovets; Igor ; et al. | 2015-08-13 |
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