Boxer Cross, INC

Patent Applications and Registrations

Patent applications and USPTO patent grants for Boxer Cross, INC.The latest application filed is for "measuring a property of a layer in multilayered structure".

Company Profile

0.10.1

Boxer Cross, INC - Santa Clara CA
Boxer Cross Inc. - Santa Clara CA
Boxer Cross Incorporated - Menlo Park CA
Boxer-Cross, Inc. - Menlo Park CA
Boxer Cross Incorporated - Menlo Park CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Identifying defects in a conductive structure of a wafer, based on heat transfer therethrough Grant 6,971,791 - Borden , et al. December 6, 2	2005-12-06
Evaluating sidewall coverage in a semiconductor wafer Grant 6,911,349 - Li , et al. June 28, 2	2005-06-28
Evaluating a multi-layered structure for voids Grant 6,885,444 - Borden , et al. April 26, 2	2005-04-26
Evaluating a geometric or material property of a multilayered structure Grant 6,812,047 - Borden , et al. November 2, 2	2004-11-02
Use of a coefficient of a power curve to evaluate a semiconductor wafer Grant 6,812,717 - Borden , et al. November 2, 2	2004-11-02
Measuring a property of a layer in multilayered structure App 20040119978 - Borden, Peter G. ; et al.	2004-06-24
Apparatus and method for determining the active dopant profile in a semiconductor wafer Grant 6,323,951 - Borden , et al. November 27, 2	2001-11-27
System and method for measuring the microroughness of a surface of a substrate Grant 6,154,280 - Borden November 28, 2	2000-11-28
Apparatus and method for measuring a property of a layer in a multilayered structure Grant 6,054,868 - Borden , et al. April 25, 2	2000-04-25
Apparatus and method for evaluating a wafer of semiconductor material Grant 6,049,220 - Borden , et al. April 11, 2	2000-04-11
System and method for measuring the microroughness of a surface of a substrate Grant 5,877,860 - Borden March 2, 1	1999-03-02

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