loadpatents
name:-0.014654874801636
name:-0.010800838470459
name:-0.0035607814788818
Bounouar; Julien Patent Filings

Bounouar; Julien

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bounouar; Julien.The latest application filed is for "method for setting an airborne molecular contamination measurement station, and measurement station".

Company Profile
2.10.13
  • Bounouar; Julien - Annecy FR
  • Bounouar; Julien - Annecy-le-Vieux FR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device and method for controlling the tightness of a transport enclosure for the conveyance and atmospheric storage of semiconductor substrates
Grant 11,430,681 - Bellet , et al. August 30, 2
2022-08-30
Method For Setting An Airborne Molecular Contamination Measurement Station, And Measurement Station
App 20220099646 - BOUNOUAR; Julien ;   et al.
2022-03-31
Station And Method For Measuring Airborne Molecular Contamination
App 20210190647 - BOUNOUAR; Julien ;   et al.
2021-06-24
Device And Method For Controlling The Tightness Of A Transport Enclosure For The Conveyance And Atmospheric Storage Of Semicondu
App 20200051844 - BELLET; Bertrand ;   et al.
2020-02-13
Method and station for measuring the contamination of a transport box for the atmospheric conveyance and storage of substrates
Grant 10,431,484 - Le-Barillec , et al. O
2019-10-01
Method And Station For Measuring The Contamination Of A Transport Box For The Atmospheric Conveyance And Storage Of Substrates
App 20180247847 - LE-BARILLEC; Olivier ;   et al.
2018-08-30
Detection method and facility for checking sealed products for leaks
Grant 9,841,345 - Bounouar , et al. December 12, 2
2017-12-12
Station and method for measuring particle contamination of a transport carrier for conveying and storing semiconductor substrates at atmospheric pressure
Grant 9,810,617 - Thovex , et al. November 7, 2
2017-11-07
Method and device for controlling the manufacture of semiconductor by measuring contamination
Grant 9,779,972 - Favre , et al. October 3, 2
2017-10-03
Station And Method For Measuring Particle Contamination Of A Transport Carrier For Conveying And Storing Semiconductor Substrates At Atmospheric Pressure
App 20150276572 - Thovex; Cindy ;   et al.
2015-10-01
Detection Method And Facility For Checking Sealed Products For Leaks
App 20150211955 - Bounouar; Julien ;   et al.
2015-07-30
Method And Device for The Depollution Of A Pelliculated Reticle
App 20130152977 - Favre; Arnaud ;   et al.
2013-06-20
System for analyzing a low-pressure gas by optical emission spectroscopy
Grant 8,462,335 - Bounouar , et al. June 11, 2
2013-06-11
Method and Device for Controlling the Manufacture of Semiconductor by Measuring Contamination
App 20120259449 - Favre; Arnaud ;   et al.
2012-10-11
Method For Lowering The Pressure In A Load Lock And Associated Equipment
App 20120024394 - Bounouar; Julien ;   et al.
2012-02-02
System For Analyzing A Low-pressure Gas By Optical Emission Spectroscopy
App 20100277724 - Bounouar; Julien ;   et al.
2010-11-04
Detecting gaseous species by light-emission spectrometry with spectrum processing
Grant 7,468,790 - Sogan , et al. December 23, 2
2008-12-23
Detecting minority gaseous species by light-emission spectroscopy
Grant 7,403,283 - Sogan , et al. July 22, 2
2008-07-22
Detecting minority gaseous species by light-emission spectroscopy
App 20050190364 - Sogan, Gloria ;   et al.
2005-09-01
Detecting gaseous species by light-emission spectrometry with spectrum processing
App 20050190363 - Sogan, Gloria ;   et al.
2005-09-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed