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name:-0.011382102966309
name:-0.0092060565948486
name:-0.00042295455932617
Bottini; Clemente Patent Filings

Bottini; Clemente

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bottini; Clemente.The latest application filed is for "alignment correction system and method of use".

Company Profile
0.11.10
  • Bottini; Clemente - Marlboro NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Alignment correction system and method of use
Grant 8,736,275 - Foster , et al. May 27, 2
2014-05-27
Alignment correction system and method of use
Grant 8,680,871 - Foster , et al. March 25, 2
2014-03-25
Alignment Correction System And Method Of Use
App 20130245993 - FOSTER; Robert J. ;   et al.
2013-09-19
Alignment Correction System And Method Of Use
App 20130238112 - FOSTER; Robert J. ;   et al.
2013-09-12
Alignment correction system and method of use
Grant 8,451,008 - Foster , et al. May 28, 2
2013-05-28
Monitoring stage alignment and related stage and calibration target
Grant 8,411,270 - Zangooie , et al. April 2, 2
2013-04-02
Determining angle of incidence with respect to workpiece
Grant 7,742,160 - Bottini , et al. June 22, 2
2010-06-22
Determining azimuth angle of incident beam to wafer
Grant 7,646,491 - Zangooie , et al. January 12, 2
2010-01-12
Alignment Correction System And Method Of Use
App 20090312982 - Foster; Robert J. ;   et al.
2009-12-17
Alignment correction system and method of use
Grant 7,592,817 - Foster , et al. September 22, 2
2009-09-22
Monitoring Stage Alignment And Related Stage And Calibration Target
App 20090185183 - Zangooie; Shahin ;   et al.
2009-07-23
Determining Angle Of Incidence With Respect To Workpiece
App 20090180108 - Bottini; Clemente ;   et al.
2009-07-16
Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput
Grant 7,542,136 - Zangooie , et al. June 2, 2
2009-06-02
Optical Spot Geometric Parameter Determination Using Calibration Targets
App 20090027660 - Zangooie; Shahin ;   et al.
2009-01-29
Alignment Correction System and Method of Use
App 20090021236 - Foster; Robert J. ;   et al.
2009-01-22
Optical spot geometric parameter determination using calibration targets
Grant 7,477,365 - Zangooie , et al. January 13, 2
2009-01-13
Flipping Stage Arrangement For Reduced Wafer Contamination Cross Section And Improved Measurement Accuracy And Throughput
App 20090009763 - Zangooie; Shahin ;   et al.
2009-01-08
Determining Azimuth Angle Of Incident Beam To Wafer
App 20080316471 - Zangooie; Shahin ;   et al.
2008-12-25
Optical spot geometric parameter determination using calibration targets
App 20080024781 - Zangooie; Shahin ;   et al.
2008-01-31

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