loadpatents
Patent applications and USPTO patent grants for Bonner; Benjamin A..The latest application filed is for "cvd based metal/semiconductor ohmic contact for high volume manufacturing applications".
Patent | Date |
---|---|
CVD based metal/semiconductor OHMIC contact for high volume manufacturing applications Grant 9,153,486 - Arghavani , et al. October 6, 2 | 2015-10-06 |
Cvd Based Metal/semiconductor Ohmic Contact For High Volume Manufacturing Applications App 20140308812 - Arghavani; Reza ;   et al. | 2014-10-16 |
Method Of Forming Polishing Sheet App 20140237905 - Bonner; Benjamin A. ;   et al. | 2014-08-28 |
Partial Contact Wafer Retaining Ring Apparatus App 20100120335 - Fang; Haoquan ;   et al. | 2010-05-13 |
Monolithic Linear Polishing Sheet App 20100112919 - Bonner; Benjamin A. ;   et al. | 2010-05-06 |
Polishing apparatus with grooved subpad Grant 7,601,050 - Zuniga , et al. October 13, 2 | 2009-10-13 |
Leader And Trailer For Linear Polishing Sheet App 20090088051 - Menk; Gregory E. ;   et al. | 2009-04-02 |
Materials for chemical mechanical polishing Grant 7,429,210 - Bonner , et al. September 30, 2 | 2008-09-30 |
High Selectivity Slurry Compositions For Chemical Mechanical Polishing App 20070218693 - Bonner; Benjamin A. ;   et al. | 2007-09-20 |
Smart polishing media assembly for planarizing substrates App 20070212976 - McReynolds; Peter ;   et al. | 2007-09-13 |
Polishing apparatus with grooved subpad App 20070197141 - Zuniga; Steven M. ;   et al. | 2007-08-23 |
Polishing system with spiral-grooved subpad App 20070197147 - Rondum; Erik S. ;   et al. | 2007-08-23 |
Materials For Chemical Mechanical Polishing App 20070117500 - BONNER; BENJAMIN A. ;   et al. | 2007-05-24 |
Materials for chemical mechanical polishing Grant 7,179,159 - Bonner , et al. February 20, 2 | 2007-02-20 |
Materials for chemical mechanical polishing App 20060246831 - Bonner; Benjamin A. ;   et al. | 2006-11-02 |
High selectivity slurry compositions for chemical mechanical polishing App 20060097219 - Bonner; Benjamin A. ;   et al. | 2006-05-11 |
Carrier head with a modified flexible membrane Grant 6,855,043 - Tang , et al. February 15, 2 | 2005-02-15 |
Closed loop control over delivery of liquid material to semiconductor processing tool Grant 6,834,777 - Osterheld , et al. December 28, 2 | 2004-12-28 |
Methods and compositions for chemical mechanical polishing shallow trench isolation substrates Grant 6,811,470 - Bonner , et al. November 2, 2 | 2004-11-02 |
Closed loop control over delivery of liquid material to semiconductor processing tool App 20030189060 - Osterheld, Thomas H. ;   et al. | 2003-10-09 |
Closed loop control over delivery of liquid material to semiconductor processing tool Grant 6,561,381 - Osterheld , et al. May 13, 2 | 2003-05-13 |
Methods and compositions for chemical mechanical polishing shallow trench isolation substrates App 20030036339 - Bonner, Benjamin A. ;   et al. | 2003-02-20 |
Multi-step polish process to control uniformity when using a selective slurry on patterned wafers App 20020100743 - Bonner, Benjamin A. ;   et al. | 2002-08-01 |
Utility wafer for chemical mechanical polishing Grant 6,361,405 - David , et al. March 26, 2 | 2002-03-26 |
Utility wafer for chemical mechanical polishing App 20020028635 - David, Jeffrey D. ;   et al. | 2002-03-07 |
Method of post CMP defect stability improvement Grant 6,220,941 - Fishkin , et al. April 24, 2 | 2001-04-24 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.