Boisseau; Raymond P.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Boisseau; Raymond P..The latest application filed is for "multi-layer range measurement for characterizing charged particle beams".
- Boisseau; Raymond P. - Waltham MA
| Patent | Date |
|---|---|
| Multi-layer range measurement for characterizing charged particle beams Grant 9,981,146 - Boisseau , et al. May 29, 2 | 2018-05-29 |
| Multi-Layer Range Measurement for Characterizing Charged Particle Beams App 20180104512 - Boisseau; Raymond P. ; et al. | 2018-04-19 |
| Multi-Layer Range Measurement Apparatus for Characterizing Charged Particle Beams App 20180056094 - Boisseau; Raymond P. ; et al. | 2018-03-01 |
| Multi-layer range measurement apparatus for characterizing charged particle beams Grant 9,901,751 - Boisseau , et al. February 27, 2 | 2018-02-27 |
| Uniform cross section ion beam system Grant 4,914,305 - Benveniste , et al. April 3, 1 | 1990-04-03 |
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