Bogdanowicz; Janusz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Bogdanowicz; Janusz.The latest application filed is for "method and apparatus for measuring a lateral depth in a microstructure".

Company Profile

0.7.8

Bogdanowicz; Janusz - Schaarbeek BE
Bogdanowicz; Janusz - Brussels BE
Bogdanowicz; Janusz - Brussel BE
Bogdanowicz; Janusz - Liege BE
Bogdanowicz; Janusz - Leuven BE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and Apparatus for Measuring a Lateral Depth in a Microstructure App 20220018781 - Nuytten; Thomas ; et al.	2022-01-20
Method for differential heating of elongate nano-scaled structures Grant 10,014,178 - Vandervorst , et al. July 3, 2	2018-07-03
Method for Differential Heating of Elongate Nano-Scaled Structures App 20170178910 - Vandervorst; Wilfried ; et al.	2017-06-22
Method for determining the doping profile of a partially activated doped semiconductor region Grant 8,817,262 - Bogdanowicz August 26, 2	2014-08-26
Method for determining the active doping concentration of a doped semiconductor region Grant 8,717,570 - Bogdanowicz , et al. May 6, 2	2014-05-06
Method for determining an active dopant concentration profile Grant 8,634,080 - Bogdanowicz January 21, 2	2014-01-21
Method For Determining The Doping Profile Of A Partially Activated Doped Semiconductor Region App 20130335744 - Bogdanowicz; Janusz	2013-12-19
Method For Determining An Active Dopant Profile App 20130194577 - BOGDANOWICZ; Janusz	2013-08-01
Method For Determining The Active Doping Concentration Of A Doped Semiconductor Region App 20130155409 - BOGDANOWICZ; Janusz ; et al.	2013-06-20
Method and apparatus for determining the junction depth of a semiconductor region Grant 8,384,904 - Bogdanowicz February 26, 2	2013-02-26
Method And Apparatus For Determining The Junction Depth Of A Semiconductor Region App 20100238449 - Bogdanowicz; Janusz	2010-09-23
Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures Grant 7,751,035 - Clarysse , et al. July 6, 2	2010-07-06
Method For Determining The Doping Profile Of A Partially Activated Doped Semiconductor Region App 20100002236 - Bogdanowicz; Janusz	2010-01-07
Method And Device To Quantify Active Carrier Profiles In Ultra-shallow Semiconductor Structures App 20080224036 - Clarysse; Trudo ; et al.	2008-09-18

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