Blunn; Robert G.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Blunn; Robert G..The latest application filed is for "concurrent control of semiconductor parametric testing".
- Blunn; Robert G. - Boise ID
| Patent | Date |
|---|---|
| Dynamically adaptable semiconductor parametric testing Grant 7,383,147 - Dorough , et al. June 3, 2 | 2008-06-03 |
| Intelligent measurement modular semiconductor parametric test system Grant 7,337,088 - Velichko , et al. February 26, 2 | 2008-02-26 |
| Concurrent control of semiconductor parametric testing App 20070112538 - Velichko; Sergey A. ; et al. | 2007-05-17 |
| Dynamically adaptable semiconductor parametric testing Grant 7,165,004 - Dorough , et al. January 16, 2 | 2007-01-16 |
| Dynamically adaptable semiconductor parametric testing Grant 7,162,386 - Dorough , et al. January 9, 2 | 2007-01-09 |
| Dynamically adaptable semiconductor parametric testing Grant 7,139,672 - Dorough , et al. November 21, 2 | 2006-11-21 |
| Intelligent Measurement Modular Semiconductor Parametric Test System App 20060212253 - Velichko; Sergey A. ; et al. | 2006-09-21 |
| Dynamically adaptable semiconductor parametric testing App 20060125509 - Dorough; Michael J. ; et al. | 2006-06-15 |
| Dynamically adaptable semiconductor parametric testing App 20060122803 - Dorough; Michael J. ; et al. | 2006-06-08 |
| Dynamically adaptable semiconductor parametric testing App 20050021273 - Dorough, Michael J. ; et al. | 2005-01-27 |
| Dynamically adaptable semiconductor parametric testing App 20030212523 - Dorough, Michael J. ; et al. | 2003-11-13 |
| Intelligent measurement modular semiconductor parametric test system App 20030028343 - Velichko, Sergey A. ; et al. | 2003-02-06 |
| Concurrent control of semiconductor parametric testing App 20020152046 - Velichko, Sergey A. ; et al. | 2002-10-17 |
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