Blecher; Joseph M.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Blecher; Joseph M..The latest application filed is for "monitoring changes in photomask defectivity".
- Blecher; Joseph M. - San Jose CA
| Patent | Date |
|---|---|
| Monitoring changes in photomask defectivity Grant 9,892,503 - Guan , et al. February 13, 2 | 2018-02-13 |
| Monitoring Changes In Photomask Defectivity App 20170053395 - Guan; Chun ; et al. | 2017-02-23 |
| Monitoring changes in photomask defectivity Grant 9,518,935 - Guan , et al. December 13, 2 | 2016-12-13 |
| Reticle defect inspection with systematic defect filter Grant 9,224,195 - Li , et al. December 29, 2 | 2015-12-29 |
| Monitoring Changes In Photomask Defectivity App 20150029498 - Guan; Chun ; et al. | 2015-01-29 |
| Reticle Defect Inspection With Systematic Defect Filter App 20140205179 - Li; Bing ; et al. | 2014-07-24 |
| Reticle defect inspection with systematic defect filter Grant 8,718,353 - Li , et al. May 6, 2 | 2014-05-06 |
| Reticle Defect Inspection With Systematic Defect Filter App 20130236084 - Li; Bing ; et al. | 2013-09-12 |
| Blade server interconnection Grant 7,734,711 - Blecher , et al. June 8, 2 | 2010-06-08 |
| High bandwidth image transfer Grant 7,379,847 - Blecher , et al. May 27, 2 | 2008-05-27 |
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